Search
Now showing items 1-10 of 4924
-
Optimisation of the parameters of an extended defect model applied to non-amorphizing implants
Materials Science and Engineering: B, Elsevier, 12-2005, 124-125, 397-400Article dans une revue scientifiquefulltext -
Targeted deletion of Kv4.2 eliminates I(to,f) and results in electrical and molecular remodeling, with no evidence of ventricular hypertrophy or myocardial dysfunction
Circulation research, American Heart Association, 2005, 97; 12, 1342-50Compte-rendu et recension critique d'ouvrage -
Experiments on micromanipulation using adhesion forces in unconstrainted environment
Actes de IROS'00 : IEEE International Conference on Intelligent Robots and Systems, -, 2000, 2000Communication dans un congrès avec actes -
SOI-based nanoelectrospray emitter tips for mass spectrometry: a coupled MEMS and microfluidic design
Journal of Micromechanics and Microengineering, IOP Publishing, 01-03-2007, 17; 3, 509-514Compte-rendu et recension critique d'ouvragefulltext -
Microelectromechanical System Comprising a Deformable Portion and a Stress Sensor
US20090301176A1, 10-12-2009Brevet -
Acoustique Picoseconde à longueur d'onde variable
Systèmes femtosecondes, PUSE-MRCT-CNRS, 2001, 1Partie d'ouvrage -
Automated supervised classification of variable stars in the CoRoT programme. Method and application to the first four exoplanet fields
aap, 10-2009, 506, 519-534Compte-rendu et recension critique d'ouvragefulltext -
High resolution seismic investigation in salt mining context comparison of seismic sections
12. European Meeting of environmental and engineering geophysics, Helsinki, 04-09-2006, Proceedings of the 12th European meeting of environmental and engineering geophysics, 2006Communication dans un congrès avec actes -
Design and performance of a low-frequency non-intrusive acoustic technique for monitoring fouling in plate heat exchangers
Elsevier, 10-2007Autre communication scientifique (congrès sans actes - poster - séminaire...) -
Electrical effects of SiNx deposition on GaN MESFETs
Electronics Letters, IET, 12-04-2001, 37; 8, 527 – 528Compte-rendu et recension critique d'ouvrage