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Now showing items 1-10 of 243
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Modelling of silicon oxynitridation by nitrous oxide using the reaction rate approach
Journal of Applied Physics, American Institute of Physics, 2013, 114, 224501, 9 pagesCompte-rendu et recension critique d'ouvragefulltext
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Patterned L10-FePt for polarization of magnetic films
Journal of Applied Physics, American Institute of Physics, 2011, 109, 07A720-1-3Compte-rendu et recension critique d'ouvragefulltext
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Bragg band gaps tunability in an homogeneous piezoelectric rod with periodic electrical boundary conditions
Journal of Applied Physics, American Institute of Physics, 2014, 115, 194508, 8 pagesCompte-rendu et recension critique d'ouvragefulltext
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Electronic structure and transport properties of Si nanotubes
Journal of Applied Physics, American Institute of Physics, 2013, 114; 5, 053706Compte-rendu et recension critique d'ouvragefulltext
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Electrical characterization of (Ni/Au)/Al0.25Ga0.75N/GaN/SiC Schottky barrier diode
Journal of Applied Physics, American Institute of Physics, 2011, 110; 1, 013701-1-6Compte-rendu et recension critique d'ouvragefulltext
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Opening of simultaneous photonic and phononic band gap in two-dimensional square lattice periodic structure
Journal of Applied Physics, American Institute of Physics, 2011, 109; 1, 014507Compte-rendu et recension critique d'ouvragefulltext
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Monte Carlo based microscopic description of electron transport in GaAs/Al0.45Ga0.55As quantum-cascade laser structure
Journal of Applied Physics, American Institute of Physics, 2010, 108; 7, 073106Compte-rendu et recension critique d'ouvragefulltext
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Self-consistent electrothermal Monte Carlo simulation of single InAs nanowire channel metal-insulator field-effect transistors
Journal of Applied Physics, American Institute of Physics, 2010, 108, 084506-1-7Compte-rendu et recension critique d'ouvragefulltext
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Legendre polynomial modeling of composite bulk acoustic wave resonators
Journal of Applied Physics, American Institute of Physics, 2008, 104; 1, 014508Compte-rendu et recension critique d'ouvragefulltext
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Surface states and conductivity of silicon nano-wires
Journal of Applied Physics, American Institute of Physics, 2013, 113; 13, 134502Compte-rendu et recension critique d'ouvragefulltext