A Digital Delay Line with Coarse/Fine ...
Type de document :
Communication dans un congrès avec actes
Titre :
A Digital Delay Line with Coarse/Fine tuning through Gate/Body biasing in 28nm FDSOI
Auteur(s) :
Sourikopoulos, Ilias [Auteur]
Frappé, Antoine [Auteur]
Microélectronique Silicium - IEMN [MICROELEC SI - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Cathelin, Andreia [Auteur]
Clavier, Laurent [Auteur]
Circuits Systèmes Applications des Micro-ondes - IEMN [CSAM - IEMN]
Ecole nationale supérieure Mines-Télécom Lille Douai [IMT Lille Douai]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Kaiser, Andreas [Auteur]
Microélectronique Silicium - IEMN [MICROELEC SI - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Frappé, Antoine [Auteur]
Microélectronique Silicium - IEMN [MICROELEC SI - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Cathelin, Andreia [Auteur]
Clavier, Laurent [Auteur]

Circuits Systèmes Applications des Micro-ondes - IEMN [CSAM - IEMN]
Ecole nationale supérieure Mines-Télécom Lille Douai [IMT Lille Douai]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Kaiser, Andreas [Auteur]
Microélectronique Silicium - IEMN [MICROELEC SI - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Titre de la manifestation scientifique :
46th European Solid-State Device Research Conference (ESSDERC) / 42nd European Solid-State Circuits Conference (ESSCIRC)
Ville :
Lausanne
Pays :
Suisse
Date de début de la manifestation scientifique :
2016-09-12
Titre de l’ouvrage :
46th European Solid-State Device Research Conference (ESSDERC) / 42nd European Solid-State Circuits Conference (ESSCIRC)
Titre de la revue :
Proceedings 42nd European Solid-State Circuits Conference, ESSCIRC 2016
Éditeur :
IEEE
Date de publication :
2016
Mot(s)-clé(s) en anglais :
Delay element
FDSOI
body-biasing
digital delay line
FDSOI
body-biasing
digital delay line
Discipline(s) HAL :
Sciences de l'ingénieur [physics]
Résumé en anglais : [en]
This paper discusses the design and characterization of a programmable digital delay line. The core of the proposed architecture is a thyristor-type delay element featuring the capability for coarse/fine tuning without ...
Lire la suite >This paper discusses the design and characterization of a programmable digital delay line. The core of the proposed architecture is a thyristor-type delay element featuring the capability for coarse/fine tuning without using any additional hardware. This is made possible by taking advantage of body biasing features available in 28nm FDSOI CMOS. Body biasing offers unique performance characteristics, notably a very low sensitivity to the biasing voltage. The prototype delay line was designed featuring thermometer-code multi-stage activation and gate/body biasing control. A delay range from 560ps to 16.13ns is exhibited for the delay line with a 2GS/s input stream. The unit delay cell exhibits fs/mV sensitivity combined with an order of magnitude larger delay dynamic range and an energy efficiency of only 12.5 fJ/event.Lire moins >
Lire la suite >This paper discusses the design and characterization of a programmable digital delay line. The core of the proposed architecture is a thyristor-type delay element featuring the capability for coarse/fine tuning without using any additional hardware. This is made possible by taking advantage of body biasing features available in 28nm FDSOI CMOS. Body biasing offers unique performance characteristics, notably a very low sensitivity to the biasing voltage. The prototype delay line was designed featuring thermometer-code multi-stage activation and gate/body biasing control. A delay range from 560ps to 16.13ns is exhibited for the delay line with a 2GS/s input stream. The unit delay cell exhibits fs/mV sensitivity combined with an order of magnitude larger delay dynamic range and an energy efficiency of only 12.5 fJ/event.Lire moins >
Langue :
Anglais
Comité de lecture :
Oui
Audience :
Internationale
Vulgarisation :
Non
Source :