Title :

Thermal influence on S₂₂ kink behavior of a 0.15 μm gate length AlGaN/GaN/SiC HEMT for microwave applications

Author(s) :

Alim, Mohammad A [Auteur]
Rezazadeh, Ali A [Auteur]
University of Manchester [Manchester]
Gaquière, Christophe [Auteur]
Puissance - IEMN [PUISSANCE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Crupi, Giovanni [Auteur]
University of Messina

Journal title :

Semiconductor Science and Technology

Pages :

035002

Publisher :

IOP Publishing

Publication date :

2019-03

ISSN :

0268-1242

English keyword(s) :

0.15μm gate length GaN on SiC HEMT
two S22 kinks
scattering parameter measurements
equivalent circuit
temperature

HAL domain(s) :

Sciences de l'ingénieur [physics]

English abstract : [en]

AbstractThermal influence on S22 kink behavior has been carried out on a 0.15 μm gate length AlGaN/GaN/SiC high electron mobility transistor over a wide range of temperature. The size and the shape of the S22 kink effect ...
Show more >AbstractThermal influence on S22 kink behavior has been carried out on a 0.15 μm gate length AlGaN/GaN/SiC high electron mobility transistor over a wide range of temperature. The size and the shape of the S22 kink effect (KE) in terms of biasing and temperature have been evaluated. The main finding is that S22 of the studied device is affected by two kinks: the first one appears at approximately 19 GHz and then the second one appears at about 43 GHz. The impact of the intrinsic circuit parameters on the S22 kink phenomena is inspected to assess their contribution. In addition, a new procedure is proposed to quantify this type of phenomenon by defining the kink area as the area between the two curves corresponding to S22 with and without the KE. The relevance of this study emerges from the fact that an exhaustive characterization of these anomalous phenomena can empower RF engineers to effectively take them into account for both modeling and design purposes.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL