Multiport Vector Network Analyzer Configured in RF Interferometric Mode for Reference Impedance Renormalization

Haddadi, Kamel; Okada, Etienne; Daffe, K.; Mubarak, F.; Théron, Didier; Dambrine, Gilles

Document type :

Autre communication scientifique (congrès sans actes - poster - séminaire...): Communication dans un congrès avec actes

DOI :

10.1109/MWSYM.2019.8700783

Title :

Multiport Vector Network Analyzer Configured in RF Interferometric Mode for Reference Impedance Renormalization

Author(s) :

Haddadi, Kamel [Auteur]

Circuits Systèmes Applications des Micro-ondes - IEMN [CSAM - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Okada, Etienne [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Daffe, K. [Auteur]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Mubarak, F. [Auteur]
Théron, Didier [Auteur]

Nano and Microsystems - IEMN [NAM6 - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Dambrine, Gilles [Auteur]

Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Conference title :

2019 IEEE/MTT-S International Microwave Symposium - IMS 2019

City :

Boston

Country :

France

Start date of the conference :

2019-06-02

Publisher :

IEEE

English keyword(s) :

multiport vector network analyzer
microwave interferometry
extreme impedance
vector calibration

HAL domain(s) :

Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

English abstract : [en]

A novel active microwave interferometric technique is implemented on a multiport vector network analyzer for renormalizing the reference impedance 50 Ohms into any desired complex impedance. The resulting measured reflection ...
Show more >A novel active microwave interferometric technique is implemented on a multiport vector network analyzer for renormalizing the reference impedance 50 Ohms into any desired complex impedance. The resulting measured reflection coefficient around the new reference impedance is around zero, resulting in high measurement sensitivity. The method proposed avoids any external component commonly found in interferometric setups. In addition, a zeroing process including vector calibration is developed for broad frequency range and requires only a software procedure to be implemented in the system framework.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

European Project :

Microwave Microscopy for Advanced and Efficient Materials Analysis and Production

Collections :