Title :

Feasibility of passive tomography of extended defects using ambient elastic noise correlation

Author(s) :

Druet, Tom [Auteur]
Transduction, Propagation et Imagerie Acoustique - IEMN [TPIA - IEMN]
Chapuis, B. [Auteur]
Moulin, Emmanuel [Auteur]
Transduction, Propagation et Imagerie Acoustique - IEMN [TPIA - IEMN]

Journal title :

Physics Procedia

Pages :

640-643

Publisher :

Elsevier

Publication date :

2015

ISSN :

1875-3892

English keyword(s) :

Acoustic noise
Compressed air
Correlation detectors
Guided electromagnetic wave propagation
Plates (structural components)
Tomography
Cross correlations
Experimental Images
Extended defect
Noise correlation
Passive tomography
Plate-like structure
Time-of-flight tomographies
Tomography algorithm
Structural health monitoring

HAL domain(s) :

Physique [physics]

English abstract : [en]

Using guided waves in structural health monitoring seems interesting because of their capability to propagate over long distances. This paper shows that tomography algorithms using guided waves in plate-like structures and ...
Show more >Using guided waves in structural health monitoring seems interesting because of their capability to propagate over long distances. This paper shows that tomography algorithms using guided waves in plate-like structures and cross-correlation of ambient noise can be combined to process the passive tomography of a structure. This can make a very robust and low power SHM system. An active tomography image has been performed with a time-of-flight tomography algorithm using experimental data produced by piezoelectric transducers. Comparison between active signals and passive signals which come from cross-correlation of ambient noise produced by compressed air sprayed on an aluminum plate shows that it is possible to detect time-of-flight passively.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Comment :

Conference of ICU International Congress on Ultrasonics, ICU 2015 ; Conference Date: 11 May 2015 Through 14 May 2015

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL