Titre :

Geometrical optics-based model for dielectric constant and loss tangent free-space measurement

Auteur(s) :

Haddadi, Kamel [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Lasri, Tuami [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Titre de la revue :

IEEE Transactions on Instrumentation and Measurement

Pagination :

1818-1823

Éditeur :

Institute of Electrical and Electronics Engineers

Date de publication :

2014

ISSN :

0018-9456

Mot(s)-clé(s) en anglais :

Calibration
S-parameters
complex permittivity
free-space
geometrical optics
reflectometer
wireless local area networks (WLANs)

Résumé en anglais : [en]

A microwave free-space reflection method for determining the complex permittivity of planar dielectric materials is demonstrated. The method makes use of the measurement of the near-field microwave reflection coefficient ...
Lire la suite >A microwave free-space reflection method for determining the complex permittivity of planar dielectric materials is demonstrated. The method makes use of the measurement of the near-field microwave reflection coefficient of a metal-backed sample. The modeling of the structure and its calibration are based on geometrical optics considering spherical electromagnetic waves propagating through the material. The technique that presents a number of features such as low-cost, compactness, robustness, and reliability is a good candidate for industrial applications. As a demonstration, dielectric parameters extraction of building materials is experimentally demonstrated for wireless local area network operations in the 2.45- and 5-GHz bands.Lire moins >

Langue :

Anglais

Vulgarisation :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL