Title :

Laser ultrasonics and mode conversion for flaw depth gauging

Author(s) :

Faëse, Frédéric [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Jenot, Frédéric [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Ouaftouh, Mohammadi [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Duquennoy, Marc [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Ourak, Mohamed [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Conference title :

13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII

City :

Le Mans

Country :

France

Start date of the conference :

2013

Book title :

Proceedings of 13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII

Publication date :

2013

English keyword(s) :

non destructive testing (NDT)
laser ultrasonics
Rayleigh waves
mode conversion
flaw depth gauging

English abstract : [en]

Compared to earliest non destructive testing and evaluation methods based on transducers, laser ultrasonics shows specific advantages. It is a non-contact method combining a high spatial resolution and a large bandwidth, ...
Show more >Compared to earliest non destructive testing and evaluation methods based on transducers, laser ultrasonics shows specific advantages. It is a non-contact method combining a high spatial resolution and a large bandwidth, allowing high temperature and/or geometrically complex materials testing. In this work, ultrasonic waves are generated in an aluminium sample by a pulsed Nd:YAG laser in the thermoelastic mode. An interferometric optical probe is used to detect surface waves after their interaction with a flaw. This study will particularly focus on two Rayleigh waves. The first one is directly transmitted by the flaw whereas the second one is mode-converted from the head wave. Considering the relative amplitude of these two waves, experimental results lead to an original flaw depth gauging method.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Non spécifiée

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL