Title :

The parametric propagation in underwater acoustics : experimental results

Author(s) :

Bouttard, E. [Auteur]
Institut de Recherche de l'Ecole Navale [IRENAV]
Labat, V. [Auteur]
Institut de Recherche de l'Ecole Navale [IRENAV]
Bou Matar Lacaze, Olivier [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Chonavel, Thierry [Auteur]
Département Signal et Communications [SC]
Lab-STICC_TB_CID_TOMS

Scientific editor(s) :

Société Française d'Acoustique

Conference title :

Acoustics 2012

City :

Nantes

Country :

France

Start date of the conference :

2012-04-23

Publication date :

2012-04-23

HAL domain(s) :

Sciences de l'ingénieur [physics]/Acoustique [physics.class-ph]
Physique [physics]/Mécanique [physics]/Acoustique [physics.class-ph]

English abstract : [en]

In underwater acoustics, detection of buried objects in sediments (cables, mines, . . . ) is a complex problem. Indeed, in order to ensure su cient penetration depth in marine sediments, low frequencies have to be used, ...
Show more >In underwater acoustics, detection of buried objects in sediments (cables, mines, . . . ) is a complex problem. Indeed, in order to ensure su cient penetration depth in marine sediments, low frequencies have to be used, implying a low resolution. A solution proposed to solve this problem is the parametric emission based on the nonlinear properties of seawater. This method can generate a low frequency wave from two directional high frequencies beams. The aim of this work is to present experimental results of a parametric propagation. Experiments have been carried out in a water tank in various configurations. These experimental measurements are then compared with simulation results obtained with a numerical model based on a fractional-step method presented at the Underwater Acoustic Measurements conference in 2011.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Non spécifiée

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL