Wavelength selection in the crown splash

Zhang, Li V.; Brunet, Philippe; Eggers, Jens; Deegan, Robert D.

Document type :

Article dans une revue scientifique

DOI :

10.1063/1.3526743

Title :

Wavelength selection in the crown splash

Author(s) :

Zhang, Li V. [Auteur]
University of Michigan [Ann Arbor]
Brunet, Philippe [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Eggers, Jens [Auteur]
University of Bristol [Bristol]
Deegan, Robert D. [Auteur]
University of Michigan [Ann Arbor]

Journal title :

Physics of Fluids

Pages :

122105-1-9

Publisher :

American Institute of Physics

Publication date :

2010

ISSN :

1070-6631

HAL domain(s) :

Sciences de l'ingénieur [physics]

English abstract : [en]

The impact of a drop onto a liquid layer produces a splash that results from the ejection and dissolution of one or more liquid sheets, which expand radially from the point of impact. In the crown splash parameter regime, ...
Show more >The impact of a drop onto a liquid layer produces a splash that results from the ejection and dissolution of one or more liquid sheets, which expand radially from the point of impact. In the crown splash parameter regime, secondary droplets appear at fairly regularly spaced intervals along the rim of the sheet. By performing many experiments for the same parameter values, we measure the spectrum of small-amplitude perturbations growing on the rim. We show that for a range of parameters in the crown splash regime, the generation of secondary droplets results from a Rayleigh–Plateau instability of the rim, whose shape is almost cylindrical. In our theoretical calculation, we include the time dependence of the base state. The remaining irregularity of the pattern is explained by the finite width of the Rayleigh-Plateau dispersion relation. Alternative mechanisms, such as the Rayleigh–Taylor instability, can be excluded for the experimental parameters of our studyShow less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL

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