Artificial duplication of polarization fatigue in Pb(Zr0.54Ti0.46)O3 thin film capacitors

Bouregba, Rachid; Sama, Nossikpendou; Soyer, Caroline; Poullain, Gilles; Remiens, Denis

Type de document :

Compte-rendu et recension critique d'ouvrage

DOI :

10.1016/j.tsf.2012.11.098

Titre :

Artificial duplication of polarization fatigue in Pb(Zr0.54Ti0.46)O3 thin film capacitors

Auteur(s) :

Bouregba, Rachid [Auteur]
Laboratoire de cristallographie et sciences des matériaux [CRISMAT]
Sama, Nossikpendou [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Soyer, Caroline [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Poullain, Gilles [Auteur]
Laboratoire de cristallographie et sciences des matériaux [CRISMAT]
Remiens, Denis [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Titre de la revue :

Thin Solid Films

Pagination :

327-333

Éditeur :

Elsevier

Date de publication :

2013

ISSN :

0040-6090

Mot(s)-clé(s) en anglais :

Ferroelectrics
Lead zirconate titanate
Thin films
Polarization
Fatigue
Modeling
Interface defects

Discipline(s) HAL :

Physique [physics]/Matière Condensée [cond-mat]/Science des matériaux [cond-mat.mtrl-sci]

Résumé en anglais : [en]

Polarization fatigue in ferroelectric perovskite oxides is a commonly known phenomenon. However no model has promoted consensual interpretation regarding its nature. In this article, the polarization loop of a Pb(Zr0.54Ti0.46)O3 ...
Lire la suite >Polarization fatigue in ferroelectric perovskite oxides is a commonly known phenomenon. However no model has promoted consensual interpretation regarding its nature. In this article, the polarization loop of a Pb(Zr0.54Ti0.46)O3 thin film capacitor measured at a given moment of the fatigue process is entirely duplicated after bringing in series with a fresh sample an electrical circuit calibrated in a way to model the aging mechanism. The latter was analyzed by considering time dependent interface properties but invariant bulk values. Unequivocal demonstration is made that fatigue polarization in the studied sample resulted from decline of the electric properties of the interfaces, leading to a decrease in the electric field actually applied to the switching domains. Injection of charge at interface defects, caused by polarization reversal, was probably the vector of these degradations.Lire moins >

Langue :

Anglais

Vulgarisation :

Non

Collections :