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Phonon surface mapping of graphite : ...
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Document type :
Article dans une revue scientifique
DOI :
10.1103/PhysRevB.80.085423
Title :
Phonon surface mapping of graphite : disentangling quasi-degenerate phonon dispersions
Author(s) :
Gruneis, A. [Auteur]
Serrano, J. [Auteur]
Bosak, A. [Auteur]
Lazzeri, M. [Auteur]
Molodtsov, S.L. [Auteur]
Wirtz, L. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Attaccalite, Claudio [Auteur]
Krisch, M. [Auteur]
Rubio, A. [Auteur]
Mauri, Francesco [Auteur]
Pichler, T. [Auteur]
Journal title :
Physical Review B: Condensed Matter and Materials Physics (1998-2015)
Pages :
085423-1-5
Publisher :
American Physical Society
Publication date :
2009
ISSN :
1098-0121
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
The two-dimensional mapping of the phonon dispersions around the K point of graphite by inelastic x-ray scattering is provided. The present work resolves the longstanding issue related to the correct assignment of transverse ...
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The two-dimensional mapping of the phonon dispersions around the K point of graphite by inelastic x-ray scattering is provided. The present work resolves the longstanding issue related to the correct assignment of transverse and longitudinal phonon branches at K. We observe an almost degeneracy of the three TO, LA and LO derived phonon branches and a strong phonon trigonal warping. Correlation effects renormalize the Kohn anomaly of the TO mode, which exhibits a trigonal warping effect opposite to that of the electronic band structure. We determined the electron–phonon coupling constant to be 166(eV/˚A)2 in excellent agreement to GW calculations. These results are fundamental for understanding angle-resolved photoemission, double–resonance Raman and transport measurements of graphene based systems.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Non spécifiée
Popular science :
Non
Collections :
  • Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
Source :
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