Thin chitosan films as a platform for SPR ...
Document type :
Compte-rendu et recension critique d'ouvrage
DOI :
Title :
Thin chitosan films as a platform for SPR sensing of ferric ions
Author(s) :
Mcilwee, Holly [Auteur]
Department of Materials Science and Engineering and A. J. Drexel Nanotechnology Institute ( Philadelfia, USA)
Schauer, Caroline [Auteur]
Department of Materials Science and Engineering and A. J. Drexel Nanotechnology Institute ( Philadelfia, USA)
Praig, Vera [Auteur]
Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Institut de Recherche Interdisciplinaire [Villeneuve d'Ascq] [IRI]
Boukherroub, Rabah [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Institut de Recherche Interdisciplinaire [Villeneuve d'Ascq] [IRI]
Szunerits, Sabine [Auteur]
Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Institut de Recherche Interdisciplinaire [Villeneuve d'Ascq] [IRI]
Department of Materials Science and Engineering and A. J. Drexel Nanotechnology Institute ( Philadelfia, USA)
Schauer, Caroline [Auteur]
Department of Materials Science and Engineering and A. J. Drexel Nanotechnology Institute ( Philadelfia, USA)
Praig, Vera [Auteur]
Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Institut de Recherche Interdisciplinaire [Villeneuve d'Ascq] [IRI]
Boukherroub, Rabah [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Institut de Recherche Interdisciplinaire [Villeneuve d'Ascq] [IRI]
Szunerits, Sabine [Auteur]
Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Institut de Recherche Interdisciplinaire [Villeneuve d'Ascq] [IRI]
Journal title :
Analyst
Pages :
pp. 673-677
Publisher :
Royal Society of Chemistry
Publication date :
2008
ISSN :
0003-2654
HAL domain(s) :
Chimie/Matériaux
English abstract : [en]
Homogeneous chitosan films of various thicknesses (10–65 nm) were deposited on thin gold films through spin coating. The resulting interfaces were characterized using surface plasmon resonance (SPR), AFM, profilometry and ...
Show more >Homogeneous chitosan films of various thicknesses (10–65 nm) were deposited on thin gold films through spin coating. The resulting interfaces were characterized using surface plasmon resonance (SPR), AFM, profilometry and cyclic voltammetry. The strong chelating properties of chitosan films to Fe<sup>3+</sup> were investigated using cyclic voltammetry. Through SPR measurements, an affinity constant between chitosan and Fe<sup>3+</sup> of 9.49 × 10<sup>5</sup> M<sup>-1</sup> was determined with a detection limit as low as 250 ppb.Show less >
Show more >Homogeneous chitosan films of various thicknesses (10–65 nm) were deposited on thin gold films through spin coating. The resulting interfaces were characterized using surface plasmon resonance (SPR), AFM, profilometry and cyclic voltammetry. The strong chelating properties of chitosan films to Fe<sup>3+</sup> were investigated using cyclic voltammetry. Through SPR measurements, an affinity constant between chitosan and Fe<sup>3+</sup> of 9.49 × 10<sup>5</sup> M<sup>-1</sup> was determined with a detection limit as low as 250 ppb.Show less >
Language :
Anglais
Popular science :
Non
Source :
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