Title :

PM IRRAS Investigation of Thin Silica Films Deposited on Gold. Part 1. Theory and Proof of Concept

Author(s) :

Zawisza, Izabella [Auteur]
Institute for Chemistry and Biology of the Marine Environment [ICBM]
Wittstock, Gunther [Auteur]
Institute for Chemistry and Biology of the Marine Environment [ICBM]
Boukherroub, Rabah [Auteur]
Institut de Recherche Interdisciplinaire [Villeneuve d'Ascq] [IRI]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Szunerits, Sabine [Auteur]
Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]

Journal title :

LANGMUIR

Pages :

pp. 9303-9309

Publisher :

American Chemical Society

Publication date :

2007-08-28

ISSN :

0743-7463

HAL domain(s) :

Chimie/Matériaux

English abstract : [en]

Polarization modulation infrared reflection absorption spectroscopy (PM IRRAS) was successfully used for the first time to characterize an optically transparent thin oxide film. SiO₂ layers of 7 nm thickness ...
Show more >Polarization modulation infrared reflection absorption spectroscopy (PM IRRAS) was successfully used for the first time to characterize an optically transparent thin oxide film. SiO₂ layers of 7 nm thickness were synthesized by plasma enhanced chemical vapor deposition (PECVD) on 200 nm thick gold covered glass slides. Despite the fact that silica is transparent and absorptive to IR radiation when deposited in the form of thin films on a gold surface, it preserves the high metallic reflectivity for the IR light. At grazing angles of incidence of the IR beam, the enhancement of the normal component of the electric field at the interface is comparable to that of Au alone. In addition, the analysis of the structure of a 1,2-dimyristoyl-<i>sn</i>-glycero-3-phosphocholine (DMPC) lipid monolayer deposited using the Langmuir−Blodgett technique is demonstrated.Show less >

Language :

Anglais

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL