Title :

Split ring resonator arrays : from microwave to optics

Author(s) :

Croënne, Charles [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Carbonell, Jorge [Auteur]
Universitat Politècnica de València = Universitad Politecnica de Valencia = Polytechnic University of Valencia [UPV]
Gaillot, Davy [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Lheurette, Eric [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Mélique, Xavier [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Lippens, Didier [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Conference title :

38th European Microwave Conference, EuMC 2008

City :

Amsterdam

Country :

Pays-Bas

Start date of the conference :

2008-10-27

Book title :

Proceedings of the 38th European Microwave Conference, EuMC 2008

Publisher :

_

Publication date :

2008

English keyword(s) :

Optical ring resonators
Optical arrays
Microwave antenna arrays
Electromagnetic analysis
Infrared spectra
Metamaterials
Tellurium
Microwave measurements
Electromagnetic measurements
Fourier transforms

HAL domain(s) :

Sciences de l'ingénieur [physics]

English abstract : [en]

We numerically and experimentally investigated the electromagnetic properties of split ring resonator arrays excited under normal and oblique incidence angles and aimed at operating from the microwave to the infrared ...
Show more >We numerically and experimentally investigated the electromagnetic properties of split ring resonator arrays excited under normal and oblique incidence angles and aimed at operating from the microwave to the infrared spectral region. Through fullwave EM analysis, the electromagnetic response is demonstrated in the metamaterial regime (inclusion rather than periodicity effect) responsible for high rejection in the TE and TM modes transmission spectra which are measured via Vectorial Network Analysis (VNA) at microwave and by Fourier transform spectroscopy (FTIR) in optics.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL