Title :

Electrochemical investigation of gold/silica thin film interfaces for electrochemical surface plasmon resonance studies

Author(s) :

Szunerits, Sabine [Auteur correspondant]
Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]
Boukherroub, Rabah [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Institut de Recherche Interdisciplinaire [Villeneuve d'Ascq] [IRI]

Journal title :

Electrochemistry Communications

Pages :

pp. 439-444

Publisher :

Elsevier

Publication date :

2006-03

ISSN :

1388-2481

English keyword(s) :

Gold electrode
Silica thin film
Coating
Cyclic voltammetry
Surface plasmon resonance
Anodic dissolution

HAL domain(s) :

Chimie/Matériaux

English abstract : [en]

The paper reports on the electrochemical behaviour of a thin gold film electrode coated with a 9.7 nm thick silicon dioxide (SiO_x) layer. Chemical and mechanical stable SiO_x layers on gold were ...
Show more >The paper reports on the electrochemical behaviour of a thin gold film electrode coated with a 9.7 nm thick silicon dioxide (SiO_x) layer. Chemical and mechanical stable SiO_x layers on gold were synthesised by plasma enhanced chemical vapour deposition (PECVD). The electrochemical behaviour of the thin gold film electrodes with or without SiO_x coating were compared using cyclic voltammetry (CV) in potassium chloride solutions and in the presence of an electrochemical redox mediator (Fe(CN)₆^4-) . These studies showed that homogeneous thin SiO_x layers are formed on gold, protecting efficiently the gold electrode from anodic dissolution, while preserving electrochemical mass transfer at the interface. The electrochemical dissolution of the uncoated thin gold film was further evidenced by coupled surface plasmon resonance (SPR) studies.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL