X-band power characterisation of AlInN/AlN/GaN ...
Document type :
Compte-rendu et recension critique d'ouvrage
DOI :
Title :
X-band power characterisation of AlInN/AlN/GaN HEMT grown on SiC substrate
Author(s) :
Sarazin, Nicolas [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Jardel, Olivier [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Morvan, Erwan [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Aubry, Raphaël [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Laurent, M. [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Magis, M. [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Tordjman, Maurice [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Alloui, M. [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Drisse, O. [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Di Persio, J. [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Di Forte-Poisson, Marie-Antoinette [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Delage, Sylvain Laurent [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Vellas, Nicolas [Auteur]
Gaquiere, Christophe [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Théron, Didier [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Alcatel-Thales III-V Lab [III-V Lab ]
Jardel, Olivier [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Morvan, Erwan [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Aubry, Raphaël [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Laurent, M. [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Magis, M. [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Tordjman, Maurice [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Alloui, M. [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Drisse, O. [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Di Persio, J. [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Di Forte-Poisson, Marie-Antoinette [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Delage, Sylvain Laurent [Auteur]
Alcatel-Thales III-V Lab [III-V Lab ]
Vellas, Nicolas [Auteur]
Gaquiere, Christophe [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Théron, Didier [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Journal title :
Electronics Letters
Pages :
1317-1318
Publisher :
IET
Publication date :
2007
ISSN :
0013-5194
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
AlInN/AlN/GaN based HEMTs were fabricated on SiC substrate to demonstrate the high potentiality of these heterostructures. The presented results confirm the high performances reachable by AlInN based technology with an ...
Show more >AlInN/AlN/GaN based HEMTs were fabricated on SiC substrate to demonstrate the high potentiality of these heterostructures. The presented results confirm the high performances reachable by AlInN based technology with an output power of 6.8 W/mm at 10 GHz with a gate length of 0.25 µm. A good extrinsic transconductance value of 400 mS/mm was also measured on these transistors. The results are believed to be the best power results published about AlInN/GaN HEMTs.Show less >
Show more >AlInN/AlN/GaN based HEMTs were fabricated on SiC substrate to demonstrate the high potentiality of these heterostructures. The presented results confirm the high performances reachable by AlInN based technology with an output power of 6.8 W/mm at 10 GHz with a gate length of 0.25 µm. A good extrinsic transconductance value of 400 mS/mm was also measured on these transistors. The results are believed to be the best power results published about AlInN/GaN HEMTs.Show less >
Language :
Anglais
Popular science :
Non
Source :