Charge-injection mechanisms in semiconductor ...
Document type :
Article dans une revue scientifique
Title :
Charge-injection mechanisms in semiconductor nanoparticles analyzed from force microscopy experiments
Author(s) :
Barbet, Sophie [Auteur]
Physique - IEMN [PHYSIQUE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Melin, Thierry [Auteur]
Physique - IEMN [PHYSIQUE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Diesinger, Heinrich [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Deresmes, D. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Stiévenard, Didier [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Physique - IEMN [PHYSIQUE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Melin, Thierry [Auteur]

Physique - IEMN [PHYSIQUE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Diesinger, Heinrich [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Deresmes, D. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Stiévenard, Didier [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Journal title :
Physical Review B: Condensed Matter and Materials Physics (1998-2015)
Pages :
045318
Publisher :
American Physical Society
Publication date :
2006-01-15
ISSN :
1098-0121
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
Charge-injection and electric force microscopy experiments are performed in silicon nanoparticles deposited on a doped silicon substrate. We address in this paper the issue of the nanoparticle charging mechanisms. The ...
Show more >Charge-injection and electric force microscopy experiments are performed in silicon nanoparticles deposited on a doped silicon substrate. We address in this paper the issue of the nanoparticle charging mechanisms. The nanoparticle charging is shown to occur in a regime of permanent current flow between the tip and substrate, during which the injected charge gets confined in the form of a two-dimensional electron gas at the nanoparticle-substrate interface. The equilibrium nanoparticle charge is calculated in a variational SchrödingerPoisson model in the effective mass approximation. The linearity of charge-voltage characteristics is discussed.Show less >
Show more >Charge-injection and electric force microscopy experiments are performed in silicon nanoparticles deposited on a doped silicon substrate. We address in this paper the issue of the nanoparticle charging mechanisms. The nanoparticle charging is shown to occur in a regime of permanent current flow between the tip and substrate, during which the injected charge gets confined in the form of a two-dimensional electron gas at the nanoparticle-substrate interface. The equilibrium nanoparticle charge is calculated in a variational SchrödingerPoisson model in the effective mass approximation. The linearity of charge-voltage characteristics is discussed.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
Source :
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