Title :

Charge-injection mechanisms in semiconductor nanoparticles analyzed from force microscopy experiments

Author(s) :

Barbet, Sophie [Auteur]
Physique - IEMN [PHYSIQUE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Melin, Thierry [Auteur]
Physique - IEMN [PHYSIQUE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Diesinger, Heinrich [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Deresmes, D. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Stiévenard, Didier [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Journal title :

Physical Review B: Condensed Matter and Materials Physics (1998-2015)

Pages :

045318

Publisher :

American Physical Society

Publication date :

2006-01-15

ISSN :

1098-0121

HAL domain(s) :

Sciences de l'ingénieur [physics]

English abstract : [en]

Charge-injection and electric force microscopy experiments are performed in silicon nanoparticles deposited on a doped silicon substrate. We address in this paper the issue of the nanoparticle charging mechanisms. The ...
Show more >Charge-injection and electric force microscopy experiments are performed in silicon nanoparticles deposited on a doped silicon substrate. We address in this paper the issue of the nanoparticle charging mechanisms. The nanoparticle charging is shown to occur in a regime of permanent current flow between the tip and substrate, during which the injected charge gets confined in the form of a two-dimensional electron gas at the nanoparticle-substrate interface. The equilibrium nanoparticle charge is calculated in a variational SchrödingerPoisson model in the effective mass approximation. The linearity of charge-voltage characteristics is discussed.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL