Title :

Design and experimental verification of backward wave propagation in periodic waveguide structures

Author(s) :

Carbonell, Jorge [Auteur]
Universitat Politècnica de València = Universitad Politecnica de Valencia = Polytechnic University of Valencia [UPV]
Rogla, Luis J. [Auteur]
Universitat Politècnica de València = Universitad Politecnica de Valencia = Polytechnic University of Valencia [UPV]
Boria, Vicente [Auteur]
Universitat Politècnica de València = Universitad Politecnica de Valencia = Polytechnic University of Valencia [UPV]
Lippens, Didier [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Journal title :

IEEE Transactions on Microwave Theory and Techniques

Pages :

1527-1533

Publisher :

Institute of Electrical and Electronics Engineers

Publication date :

2006-06

ISSN :

0018-9480

English keyword(s) :

Periodic structures
Dielectric loss measurement
Electromagnetic waveguides
Dielectric measurements
Propagation losses
Prototypes
Length measurement
Dielectric losses
Loss measurement
Electromagnetic measurements

HAL domain(s) :

Sciences de l'ingénieur [physics]

English abstract : [en]

Experimental results for the demonstration of backward-wave or double-negative (DNG) propagation in waveguide technology combining inductive windows and split-ring resonators are presented and discussed in depth. A novel ...
Show more >Experimental results for the demonstration of backward-wave or double-negative (DNG) propagation in waveguide technology combining inductive windows and split-ring resonators are presented and discussed in depth. A novel segmented prototype has been designed, fabricated, and measured, thus allowing the analysis and discussion of different length structures. The experimental characterization proves the DNG nature of the devices by comparing the phase of the transmission coefficient S/sub 21/ for different length structures. Dielectric and metallic losses linked to the resonators also limit the transmission levels of these very compact structures in the longitudinal dimension, and the sources of such losses are interpreted through the comparison of measured results with full-wave electromagnetic simulations.Show less >

Language :

Anglais

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL