A different way of performing picosecond ...
Document type :
Article dans une revue scientifique
DOI :
Title :
A different way of performing picosecond ultrasonic measurements in thin transparent films based on laser-wavelength effects
Author(s) :
Devos, Arnaud [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Cote, Renaud [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Caruyer, Grégory [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Lefevre, Arnaud [Auteur]
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information [CEA-LETI]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Cote, Renaud [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Caruyer, Grégory [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Lefevre, Arnaud [Auteur]
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information [CEA-LETI]
Journal title :
Applied Physics Letters
Pages :
211903
Publisher :
American Institute of Physics
Publication date :
2005
ISSN :
0003-6951
HAL domain(s) :
Physique [physics]
English abstract : [en]
We present a way of using picosecond ultrasonics to simultaneously get the thickness and elastic properties of thin dielectric layers. This is based on the use of a blue probe which is shown to improve the detection of ...
Show more >We present a way of using picosecond ultrasonics to simultaneously get the thickness and elastic properties of thin dielectric layers. This is based on the use of a blue probe which is shown to improve the detection of acousto-optic oscillations in the dielectric from which the sound velocity can be measured from the refractive index. At the same wavelength a strong response of the silicon is used to detect the arrival of the acoustic pulse. We apply this scheme to various materials deposited on silicon substrates.Show less >
Show more >We present a way of using picosecond ultrasonics to simultaneously get the thickness and elastic properties of thin dielectric layers. This is based on the use of a blue probe which is shown to improve the detection of acousto-optic oscillations in the dielectric from which the sound velocity can be measured from the refractive index. At the same wavelength a strong response of the silicon is used to detect the arrival of the acoustic pulse. We apply this scheme to various materials deposited on silicon substrates.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Non spécifiée
Popular science :
Non
Source :
Files
- https://hal.archives-ouvertes.fr/hal-00124474/document
- Open access
- Access the document
- https://hal.archives-ouvertes.fr/hal-00124474/document
- Open access
- Access the document
- document
- Open access
- Access the document
- Devos2005.pdf
- Open access
- Access the document