Strain, size, and composition of InAs ...
Document type :
Article dans une revue scientifique
Title :
Strain, size, and composition of InAs quantum sticks embedded in InP determined via grazing incidence X-ray anomalous diffraction
Author(s) :
Létoublon, Antoine [Auteur]
Favre-Nicolin, Vincent [Auteur]
Renevier, Hubert [Auteur]
M.G., Proietti [Auteur]
Monat, C. [Auteur]
Laboratoire d'électronique, optoélectronique et microsystèmes [LEOM]
Gendry, M. [Auteur]
Laboratoire d'électronique, optoélectronique et microsystèmes [LEOM]
Marty, Olivier [Auteur]
Laboratoire d'Electronique, Nanotechnologies, Capteurs [LENAC]
Priester, Catherine [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Favre-Nicolin, Vincent [Auteur]
Renevier, Hubert [Auteur]
M.G., Proietti [Auteur]
Monat, C. [Auteur]
Laboratoire d'électronique, optoélectronique et microsystèmes [LEOM]
Gendry, M. [Auteur]
Laboratoire d'électronique, optoélectronique et microsystèmes [LEOM]
Marty, Olivier [Auteur]
Laboratoire d'Electronique, Nanotechnologies, Capteurs [LENAC]
Priester, Catherine [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Journal title :
Physical Review Letters
Pages :
186101
Publisher :
American Physical Society
Publication date :
2004-05-07
ISSN :
0031-9007
English keyword(s) :
InAs nanostructure anomalous diffraction synchrotron strain MBE growth
HAL domain(s) :
Physique [physics]/Matière Condensée [cond-mat]/Science des matériaux [cond-mat.mtrl-sci]
English abstract : [en]
We have used x-ray anomalous diffraction to recover the model-independent Fourier transform (x-ray structure factor) of InAs quantum sticklike islands embedded in InP. The average height of the quantum sticks, as deduced ...
Show more >We have used x-ray anomalous diffraction to recover the model-independent Fourier transform (x-ray structure factor) of InAs quantum sticklike islands embedded in InP. The average height of the quantum sticks, as deduced from the width of the structure factor profile, is 2.54 nm. The InAs out-of-plane deformation, relative to InP, is 6.1%. Diffraction anomalous fine structure provides evidence of pure InAs quantum sticks. Finite difference method calculations reproduce well the diffraction data, and give the strain along the growth direction. The chemical mixing at interfaces is also analyzed.Show less >
Show more >We have used x-ray anomalous diffraction to recover the model-independent Fourier transform (x-ray structure factor) of InAs quantum sticklike islands embedded in InP. The average height of the quantum sticks, as deduced from the width of the structure factor profile, is 2.54 nm. The InAs out-of-plane deformation, relative to InP, is 6.1%. Diffraction anomalous fine structure provides evidence of pure InAs quantum sticks. Finite difference method calculations reproduce well the diffraction data, and give the strain along the growth direction. The chemical mixing at interfaces is also analyzed.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
Comment :
4pages
Source :
Files
- http://arxiv.org/pdf/cond-mat/0309522
- Open access
- Access the document
- https://hal.archives-ouvertes.fr/hal-00085995/document
- Open access
- Access the document
- https://hal.archives-ouvertes.fr/hal-00085995/document
- Open access
- Access the document
- document
- Open access
- Access the document
- 0309522.pdf
- Open access
- Access the document
- 0309522
- Open access
- Access the document