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Denoising higher-order moments for blind ...
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Document type :
Article dans une revue scientifique
DOI :
10.1109/LWC.2020.2969157
Title :
Denoising higher-order moments for blind digital modulation identification in multiple-antenna systems
Author(s) :
Kharbech, Sofiane [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Simon, Eric [Auteur]
Télécommunication, Interférences et Compatibilité Electromagnétique - IEMN [TELICE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Belazi, Akram [Auteur]
Xiang, Wei []
Journal title :
IEEE Wireless Communications Letters
Pages :
765-769
Publisher :
IEEE comsoc
Publication date :
2020-06
ISSN :
2162-2337
English keyword(s) :
Noise reduction
MIMO communication
Receiving antennas
Estimation
Digital modulation
Higher order statistics
Cognitive radio
modulation identification
higher-order statistics
multiple-antenna systems
denoising features
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
This letter proposes a new technique that substantially improves blind digital modulation identification (DMI) algorithms that are based on higher-order statistics (HOS). The proposed technique takes advantage of noise ...
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This letter proposes a new technique that substantially improves blind digital modulation identification (DMI) algorithms that are based on higher-order statistics (HOS). The proposed technique takes advantage of noise power estimation to make an offset on higher-order moments (HOM), thus getting an estimate of noise-free HOM. When tested for multiple-antenna systems, the proposed method outperforms other DMI algorithms, in terms of identification accuracy, that are based only on cumulants or do not consider HOM denoising, even for a receiver with impairments. The improvement is achieved with the same order of complexity of the common HOS-based DMI algorithms in the same context.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
Collections :
  • Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
Source :
Harvested from HAL
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  • http://arxiv.org/pdf/2102.10371
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