Optical characterization of polychromatic organic light emitting diodes

Troadec, david; Moliton, André; Ratier, Bernard; Antony, Rémi; Hiorns, Roger C.

Document type :

Article dans une revue scientifique

DOI :

10.1063/1.1835538

Title :

Optical characterization of polychromatic organic light emitting diodes

Author(s) :

Troadec, david [Auteur]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Moliton, André [Auteur]
Unité de Microélectronique, Optoélectronique et Polymères [UMOP]
Ratier, Bernard [Auteur]
Unité de Microélectronique, Optoélectronique et Polymères [UMOP]
Antony, Rémi [Auteur]
Unité de Microélectronique, Optoélectronique et Polymères [UMOP]
Hiorns, Roger C. [Auteur]
Physico-chimie des polymères [PCP]

Journal title :

Journal of Applied Physics

Pages :

043103

Publisher :

American Institute of Physics

Publication date :

2005-02-15

ISSN :

0021-8979

HAL domain(s) :

Chimie/Matériaux

English abstract : [en]

Luminance and quantum yields of organic light emitting diodes (OLEDs) are generally calculated by using a hypothetic monochromatic emission even though the actual external emission is lower than the internal emission because ...
Show more >Luminance and quantum yields of organic light emitting diodes (OLEDs) are generally calculated by using a hypothetic monochromatic emission even though the actual external emission is lower than the internal emission because of internal reflection, and is polychromatic. For organic materials, we present the effects of the total internal reflection on quantum yields. Calculations for the luminance and the efficiency of an ideal pseudomonochromatic source are compared with those for a real polychromatic source. While we demonstrate that the calculation of the yield is practically unchanged whatever hypothesis is used, we do show, however, that by assuming that the source is pseudomonochromatic, the luminances of green and blue OLEDs are overvalued or undervalued by a factor of 4, respectively.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL

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