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Enhanced CRC-based correction of multiple ...
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Document type :
Article dans une revue scientifique
DOI :
10.1016/j.image.2021.116475
Permalink :
http://hdl.handle.net/20.500.12210/58837
Title :
Enhanced CRC-based correction of multiple errors with candidate validation
Author(s) :
Boussard, Vivien [Auteur correspondant]
Coulombe, Stéphane [Auteur]
Coudoux, François-Xavier [Auteur]
COMmunications NUMériques - IEMN [COMNUM - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Corlay, Patrick [Auteur]
COMmunications NUMériques - IEMN [COMNUM - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Journal title :
Signal Processing: Image Communication
Pages :
116475
Publisher :
Elsevier
Publication date :
2021-11
ISSN :
0923-5965
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
Cyclic redundancy checks (CRC) are widely used in transmission protocols to detect whether errors have altered a transmitted packet. It has been demonstrated in the literature that CRC can also be used to correct transmission ...
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Cyclic redundancy checks (CRC) are widely used in transmission protocols to detect whether errors have altered a transmitted packet. It has been demonstrated in the literature that CRC can also be used to correct transmission errors. In this paper, we propose an improvement of the state-of-the-art CRC-based error correction method. The proposed approach is designed to significantly increase the error correction capabilities of the previous method, by handling a greater part of error cases through the management of candidate lists and using additional validations. Simulations and results for wireless video communications over 802.11p and Bluetooth Low Energy illustrate the Peak Signal-to-Noise Ratio (PSNR) and visual quality gains achieved with the proposed approach versus the state-of-the-art and traditional approaches. These gains range on average from 1.6 dB to 7.3 dB over Bluetooth Low Energy channels with Eb/No ratio of 10 dB and 8 dB, respectively.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
Collections :
  • Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
Source :
Harvested from HAL
Submission date :
2022-01-05T05:00:23Z
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