Titre :

Selective Surfaces for Photo-Thermal Conversion for Medium Solar Temperature Applications

Auteur(s) :

Haddad, Fouzi [Auteur]
Université Aboubekr Belkaid - University of Belkaïd Abou Bekr [Tlemcen]
Hatti, Mustapha [Auteur]
Rahmoun, Khadidja [Auteur]
Université Aboubekr Belkaid - University of Belkaïd Abou Bekr [Tlemcen]
Ziouche, Katir [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
WIde baNd gap materials and Devices - IEMN [WIND - IEMN]

Titre de la revue :

International Journal of Heat and Technology

Pagination :

219-224

Éditeur :

International Information and Engineering Technology Association

Date de publication :

2022-02-28

ISSN :

0392-8764

Mot(s)-clé(s) en anglais :

photo-thermal conversion
solar paints
solar absorber
solar water heater
spectral selectivity
selective surfaces
thin layers

Discipline(s) HAL :

Sciences de l'ingénieur [physics]

Résumé en anglais : [en]

There are many effective technologies that have been developed in the field of renewable energy. In this context, this study covers a selective coating used in the photo-thermal conversion on macro-scale devices. The ...
Lire la suite >There are many effective technologies that have been developed in the field of renewable energy. In this context, this study covers a selective coating used in the photo-thermal conversion on macro-scale devices. The objective of this work is to optimize a silicon-based paint layer for solar application in the low temperature range (T<80℃) where the optimization thickness is found 21 µm. In order to apply the optimization layer (21 µm) in the solar devices that work in the medium temperature range (80℃ < T < 200℃), we propose to deposit a thin film of indium oxide using an ultrasonic spray chemical vapor deposition USCVD process to obtain finally a bilayer structure (silicon-based paint Thickness-Insensitive Selective Solar TISS / In2O3). The obtained bilayer structure was tested and characterized using spectroscopy of UV-VIS and IR, the last one was used in two modes: specular and diffuse reflection. The structural properties were investigated using the X-rays diffraction (XRD) and the morphological character was analyzed using Scanning Electron Microscope (SEM). In addition, the global results denote that the deposition of In2O3 layer improves the reflection capacity of the optimization layer (21 µm) from 8 to 11 in the NIR range.Lire moins >

Langue :

Anglais

Vulgarisation :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL