Modified AFM-tip for Infrared and THz near ...

Document type :
Communication dans un congrès avec actes
DOI :
10.1109/IRMMW-THz.2019.8873908
Title :
Modified AFM-tip for Infrared and THz near field microscopy
Author(s) :
Akalin, Tahsin [Auteur] refId
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Conference title :
2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
City :
Paris
Country :
France
Start date of the conference :
2019-09-01
Publisher :
IEEE
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
Near field microscopy is commonly achieved thanks to the exaltation of the field between a tip and the sample. The free space electromagnetic wave at infrared or THz frequencies is focused in this extremely small area ...
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Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
Collections :
Source :
Harvested from HAL