Wideband mm-Wave Integrated Passive Tuners ...
Document type :
Communication dans un congrès avec actes
Title :
Wideband mm-Wave Integrated Passive Tuners for Accurate Characterization of BiCMOS Technologies
Author(s) :
Margalef-Rovira, Marc [Auteur]
Reliable RF and Mixed-signal Systems [TIMA-RMS]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Maye, Caroline [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
Photonique THz - IEMN [PHOTONIQUE THZ - IEMN]
Lepilliet, sl [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Gloria, Daniel [Auteur]
STMicroelectronics
Ducournau, Guillaume [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Photonique THz - IEMN [PHOTONIQUE THZ - IEMN]
Gaquiere, Christophe [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
Reliable RF and Mixed-signal Systems [TIMA-RMS]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Maye, Caroline [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
Photonique THz - IEMN [PHOTONIQUE THZ - IEMN]
Lepilliet, sl [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Gloria, Daniel [Auteur]
STMicroelectronics
Ducournau, Guillaume [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Photonique THz - IEMN [PHOTONIQUE THZ - IEMN]
Gaquiere, Christophe [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
Conference title :
99th ARFTG Microwave Measurement Conference 2022, colocated with IEEE/MTT-S International Microwave Symposium, IMS 2022
City :
Denver
Country :
Etats-Unis d'Amérique
Start date of the conference :
2022-06-24
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
This paper presents an innovative impedance tuner architecture aiming at on-wafer characterization. The proposed impedance tuner is composed of an integrated attenuator, which can be tuned in an analog manner, and a ...
Show more >This paper presents an innovative impedance tuner architecture aiming at on-wafer characterization. The proposed impedance tuner is composed of an integrated attenuator, which can be tuned in an analog manner, and a transmission line. Thanks to the use of an external short-circuited probe, the effective length of the transmission line can be modified, leading to a phase shift of the reflection coefficient while the attenuator controls its magnitude. Measurement-based results are presented to prove the precision obtained using the external short-circuited probe, while simulation-based results show the performance of the overall system. The system allows complete coverage of the 140-220 GHz band with 2. 5-4.2dB maximum reflection coefficients and minimum reflection coefficients greater than 20 dB, which can be continuously tuned. On the other hand, thanks to the short-circuited probe, virtually, continuous tuning of the phase is also achievable.Show less >
Show more >This paper presents an innovative impedance tuner architecture aiming at on-wafer characterization. The proposed impedance tuner is composed of an integrated attenuator, which can be tuned in an analog manner, and a transmission line. Thanks to the use of an external short-circuited probe, the effective length of the transmission line can be modified, leading to a phase shift of the reflection coefficient while the attenuator controls its magnitude. Measurement-based results are presented to prove the precision obtained using the external short-circuited probe, while simulation-based results show the performance of the overall system. The system allows complete coverage of the 140-220 GHz band with 2. 5-4.2dB maximum reflection coefficients and minimum reflection coefficients greater than 20 dB, which can be continuously tuned. On the other hand, thanks to the short-circuited probe, virtually, continuous tuning of the phase is also achievable.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
Source :