[Invited] Challenges to measure RF noise ...
Type de document :
Communication dans un congrès avec actes
Titre :
[Invited] Challenges to measure RF noise and intermodulation performances of mmW/THz devices
Auteur(s) :
Danneville, François [Auteur]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Ghanem, Haitham [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Gonçalves, Joao Carlos Azevedo [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Lepilliet, sl [Auteur]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Gloria, Daniel [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Ducournau, Guillaume [Auteur]
Photonique THz - IEMN [PHOTONIQUE THZ - IEMN]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Ghanem, Haitham [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Gonçalves, Joao Carlos Azevedo [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Lepilliet, sl [Auteur]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Gloria, Daniel [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Ducournau, Guillaume [Auteur]
Photonique THz - IEMN [PHOTONIQUE THZ - IEMN]
Titre de la manifestation scientifique :
IEEE Latin American Electron Devices Conference (LAEDC 2022)
Ville :
Cancun
Pays :
Mexique
Date de début de la manifestation scientifique :
2022-07-04
Mot(s)-clé(s) en anglais :
mmW
THz
measurement
noise
third order intermodulation point
THz
measurement
noise
third order intermodulation point
Discipline(s) HAL :
Sciences de l'ingénieur [physics]/Electronique
Résumé en anglais : [en]
Applications in millimetre wave range and terahertz frequencies keep on increasing. In this context, drastic challenges are faced at measurement level, in particular to extract noise performance and nonlinear properties ...
Lire la suite >Applications in millimetre wave range and terahertz frequencies keep on increasing. In this context, drastic challenges are faced at measurement level, in particular to extract noise performance and nonlinear properties of devices and circuits used to build the required systems. The aim of this talk is to provide an overview of these challenges, and to describe the solutions that we have developed to respond to them.Lire moins >
Lire la suite >Applications in millimetre wave range and terahertz frequencies keep on increasing. In this context, drastic challenges are faced at measurement level, in particular to extract noise performance and nonlinear properties of devices and circuits used to build the required systems. The aim of this talk is to provide an overview of these challenges, and to describe the solutions that we have developed to respond to them.Lire moins >
Langue :
Anglais
Comité de lecture :
Oui
Audience :
Internationale
Vulgarisation :
Non
Source :
Fichiers
- https://hal.archives-ouvertes.fr/hal-03791755/document
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- LAEDC%20IEMN%20invited%20paper%20Francois%20Danneville-2.pdf
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