Title :

Explainable root cause and pathway analysis with robust and adaptive statistics

Author(s) :

Atoui, Mohamed Amine [Auteur]
Télécommunication, Interférences et Compatibilité Electromagnétique - IEMN [TELICE - IEMN]
Centre de Recherche en Informatique, Signal et Automatique de Lille - UMR 9189 [CRIStAL]
Cocquempot, Vincent [Auteur correspondant]
Centre de Recherche en Informatique, Signal et Automatique de Lille - UMR 9189 [CRIStAL]

Journal title :

Computers in Industry

Pages :

103770

Publisher :

Elsevier

Publication date :

2023-01

ISSN :

0166-3615

English keyword(s) :

Process monitoring
Root cause identification
Bayesian belief network

HAL domain(s) :

Sciences de l'ingénieur [physics]
Informatique [cs]/Automatique
Sciences de l'ingénieur [physics]/Automatique / Robotique
Statistiques [stat]/Applications [stat.AP]

English abstract : [en]

Accurate detection of faults is desired to reduce risks and costs. The identification of the propagation path of faults and the system’s variables responsible of faulty operating conditions is also paramount. This paper ...
Show more >Accurate detection of faults is desired to reduce risks and costs. The identification of the propagation path of faults and the system’s variables responsible of faulty operating conditions is also paramount. This paper presents a new alternative to a well-known Bayesian network-based approach to detect and identify root causes in multivariate processes. It deals with the complexity generated by the use of Bayesian network in terms of structure and decision making. The new strategy is straightforward and based on statistical foundations. The new approach revives the interest of Mason, Young and Tracy (MYT) decomposition of quadratic statistics and alleviates considerably the complexity of their upgrades. Comparison with previous approaches and performance evaluation using the Tennessee Eastman process demonstrate the feasibility and interest of the new proposal.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Centre de Recherche en Informatique, Signal et Automatique de Lille (CRIStAL) - UMR 9189

Source :

Harvested from HAL