Title :

Dynamic optical spectroscopy and pyrometry of static targets under optical and x-ray laser heating at the European XFEL

Author(s) :

Ball, O. B. [Auteur]
University of Edinburgh [Edin.]
Prescher, C. [Auteur]
Albert-Ludwigs-Universität Freiburg = University of Freiburg
Deutsches Elektronen-Synchrotron [Hamburg] [DESY]
Appel, K. [Auteur]
European XFEL Gmbh
Baehtz, C. [Auteur]
Helmholtz-Zentrum Dresden-Rossendorf [HZDR]
Baron, Marzena [Auteur]
Institut de minéralogie, de physique des matériaux et de cosmochimie [IMPMC]
Unité Matériaux et Transformations - UMR 8207 [UMET]
Briggs, R. [Auteur]
Lawrence Livermore National Laboratory [LLNL]
Cerantola, V. [Auteur]
European XFEL Gmbh
Chantel, Julien [Auteur]
Unité Matériaux et Transformations - UMR 8207 [UMET]
Chariton, S. [Auteur]
Center for Advanced Radiation Sources [University of Chicago] [CARS]
Coleman, A. L. [Auteur]
Lawrence Livermore National Laboratory [LLNL]
Cynn, H. [Auteur]
Lawrence Livermore National Laboratory [LLNL]
Damker, H. [Auteur]
Deutsches Elektronen-Synchrotron [Hamburg] [DESY]
Dattelbaum, D. [Auteur]
Los Alamos National Laboratory [LANL]
Dresselhaus-Marais, L. E. [Auteur]
Stanford Synchrotron Radiation Lightsource [SSRL SLAC]
Lawrence Livermore National Laboratory [LLNL]
Eggert, J. H. [Auteur]
Lawrence Livermore National Laboratory [LLNL]
Ehm, L. [Auteur]
Stony Brook University [SUNY] [SBU]
Evans, W. J. [Auteur]
Lawrence Livermore National Laboratory [LLNL]
Fiquet, G. [Auteur]
Institut de minéralogie, de physique des matériaux et de cosmochimie [IMPMC]
Frost, M. [Auteur]
Stanford Synchrotron Radiation Lightsource [SSRL SLAC]
Glazyrin, K. [Auteur]
Deutsches Elektronen-Synchrotron [Hamburg] [DESY]
Goncharov, A. F. [Auteur]
Carnegie Institution for Science
Husband, R. J. [Auteur]
Deutsches Elektronen-Synchrotron [Hamburg] [DESY]
Hwang, H. [Auteur]
Gwangju Institute of Science and Technology [GIST]
Yonsei University
Jaisle, N. [Auteur]
Institut des Sciences de la Terre [ISTerre]
Jenei, Zs. [Auteur]
Lawrence Livermore National Laboratory [LLNL]
Kim, J.-Y. [Auteur]
Hanyang University
Lee, Y. [Auteur]
Yonsei University
Liermann, H. P. [Auteur]
Deutsches Elektronen-Synchrotron [Hamburg] [DESY]
Mainberger, J. [Auteur]
Deutsches Elektronen-Synchrotron [Hamburg] [DESY]
Makita, M. [Auteur]
European XFEL Gmbh
Marquardt, H. [Auteur]
University of Oxford
McBride, E. E. [Auteur]
Stanford Synchrotron Radiation Lightsource [SSRL SLAC]
Queen's University [Belfast] [QUB]
McHardy, J. D. [Auteur]
University of Edinburgh [Edin.]
McMahon, M. I. [Auteur]
University of Edinburgh [Edin.]
Merkel, Sébastien [Auteur]
Unité Matériaux et Transformations - UMR 8207 [UMET]
Morard, G. [Auteur]
Institut de minéralogie, de physique des matériaux et de cosmochimie [IMPMC]
Institut des Sciences de la Terre [ISTerre]
O’Bannon, E. F. [Auteur]
Lawrence Livermore National Laboratory [LLNL]
Otzen, C. [Auteur]
Friedrich-Schiller-Universität = Friedrich Schiller University Jena [Jena, Germany]
Deutsches Elektronen-Synchrotron [Hamburg] [DESY]
Pace, E. J. [Auteur]
University of Edinburgh [Edin.]
Pelka, A. [Auteur]
Helmholtz-Zentrum Dresden-Rossendorf [HZDR]
Pépin, C. M. [Auteur]
DAM Île-de-France [DAM/DIF]
Université Paris-Saclay
Pigott, J. S. [Auteur]
Case Western Reserve University [Cleveland]
Los Alamos National Laboratory [LANL]
Plückthun, C. [Auteur]
Universität Rostock
Institut für Physik [Rostock]
European XFEL Gmbh
Prakapenka, V. B. [Auteur]
Center for Advanced Radiation Sources [University of Chicago] [CARS]
Redmer, R. [Auteur]
Institut für Physik [Rostock]
Speziale, S. [Auteur]
German Research Centre for Geosciences - Helmholtz-Centre Potsdam [GFZ]
Spiekermann, G. [Auteur]
Eidgenössische Technische Hochschule - Swiss Federal Institute of Technology [Zürich] [ETH Zürich]
Strohm, C. [Auteur]
Deutsches Elektronen-Synchrotron [Hamburg] [DESY]
Sturtevant, B. T. [Auteur]
Los Alamos National Laboratory [LANL]
Talkovski, P. [Auteur]
Deutsches Elektronen-Synchrotron [Hamburg] [DESY]
Wollenweber, L. [Auteur]
European XFEL Gmbh
Zastrau, U. [Auteur]
European XFEL Gmbh
McWilliams, R. S. [Auteur]
University of Edinburgh [Edin.]
Konôpková, Z. [Auteur]
European XFEL Gmbh

Journal title :

Journal of Applied Physics

Abbreviated title :

J. Appl. Phys.

Volume number :

134

Pages :

055901

Publisher :

AIP Publishing

Publication date :

2023-08-02

ISSN :

0021-8979

HAL domain(s) :

Chimie/Matériaux
Physique [physics]/Matière Condensée [cond-mat]/Science des matériaux [cond-mat.mtrl-sci]
Physique [physics]/Physique [physics]/Géophysique [physics.geo-ph]
Physique [physics]/Astrophysique [astro-ph]
Planète et Univers [physics]/Astrophysique [astro-ph]
Planète et Univers [physics]/Sciences de la Terre

English abstract : [en]

Experiments accessing extreme conditions at x-ray free electron lasers (XFELs) involve rapidly evolving conditions of temperature. Here, we report time-resolved, direct measurements of temperature using spectral streaked ...
Show more >Experiments accessing extreme conditions at x-ray free electron lasers (XFELs) involve rapidly evolving conditions of temperature. Here, we report time-resolved, direct measurements of temperature using spectral streaked optical pyrometry of x-ray and optical laser-heated states at the High Energy Density instrument of the European XFEL. This collection of typical experiments, coupled with numerical models, outlines the reliability, precision, and meaning of time dependent temperature measurements using optical emission at XFEL sources. Dynamic temperatures above 1500 K are measured continuously from spectrally- and temporally-resolved thermal emission at 450–850 nm, with time resolution down to 10–100 ns for 1–200 μs streak camera windows, using single shot and integrated modes. Targets include zero-pressure foils free-standing in air and in vacuo, and high-pressure samples compressed in diamond anvil cell multi-layer targets. Radiation sources used are 20-fs hard x-ray laser pulses at 17.8 keV, in single pulses or 2.26 MHz pulse trains of up to 30 pulses, and 250-ns infrared laser single pulses. A range of further possibilities for optical measurements of visible light in x-ray laser experiments using streak optical spectroscopy are also explored, including for the study of x-ray induced optical fluorescence, which often appears as background in thermal radiation measurements. We establish several scenarios where combined emissions from multiple sources are observed and discuss their interpretation. Challenges posed by using x-ray lasers as non-invasive probes of the sample state are addressed.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

ANR Project :

ULNE

Administrative institution(s) :

Université de Lille
CNRS
INRAE
ENSCL

Collections :

• Unité Matériaux et Transformations (UMET) - UMR 8207

Research team(s) :

Matériaux Terrestres et Planétaires

Submission date :

2023-08-06T20:09:21Z
2023-08-06T20:18:48Z
2023-08-25T13:47:49Z
2023-08-29T01:29:19Z
2023-08-29T06:01:53Z