New Insight into Nanoscale Identification ...
Document type :
Article dans une revue scientifique: Article original
DOI :
Permalink :
Title :
New Insight into Nanoscale Identification of the Polar Axis Direction in Organic Ferroelectric Films
Author(s) :
Mohandas Moolayil, Sajmohan [Auteur]
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Da Costa, Antonio [Auteur]
Unité de Catalyse et Chimie du Solide (UCCS) - UMR 8181
Tahon, Jean-Francois [Auteur]
Unité Matériaux et Transformations (UMET) - UMR 8207
Bouad, Vincent [Auteur]
Unité Matériaux et Transformations (UMET) - UMR 8207
Hamieh, Arthur [Auteur]
Unité Matériaux et Transformations - UMR 8207 [UMET]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Ponchel, Freddy [Auteur]
Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
Ladmiral, Vincent [Auteur]
Institut Charles Gerhardt Montpellier - Institut de Chimie Moléculaire et des Matériaux de Montpellier [ICGM]
Rémiens, Denis [Auteur]
Lefebvre, Jean-Marc [Auteur]
Unité Matériaux et Transformations (UMET) - UMR 8207
Desfeux, Rachel [Auteur]
UCCS Équipe Couches Minces & Nanomatériaux
Barrau, Sophie [Auteur]
Unité Matériaux et Transformations (UMET) - UMR 8207
Ferri, Anthony [Auteur]
UCCS Équipe Couches Minces & Nanomatériaux
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Da Costa, Antonio [Auteur]
Unité de Catalyse et Chimie du Solide (UCCS) - UMR 8181
Tahon, Jean-Francois [Auteur]
Unité Matériaux et Transformations (UMET) - UMR 8207
Bouad, Vincent [Auteur]
Unité Matériaux et Transformations (UMET) - UMR 8207
Hamieh, Arthur [Auteur]
Unité Matériaux et Transformations - UMR 8207 [UMET]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Ponchel, Freddy [Auteur]
Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
Ladmiral, Vincent [Auteur]
Institut Charles Gerhardt Montpellier - Institut de Chimie Moléculaire et des Matériaux de Montpellier [ICGM]
Rémiens, Denis [Auteur]
Lefebvre, Jean-Marc [Auteur]
Unité Matériaux et Transformations (UMET) - UMR 8207
Desfeux, Rachel [Auteur]
UCCS Équipe Couches Minces & Nanomatériaux
Barrau, Sophie [Auteur]
Unité Matériaux et Transformations (UMET) - UMR 8207
Ferri, Anthony [Auteur]
UCCS Équipe Couches Minces & Nanomatériaux
Journal title :
ACS Applied Materials & Interfaces
Abbreviated title :
ACS Appl. Mater. Interfaces
Volume number :
15
Pages :
51663-51674
Publisher :
American Chemical Society (ACS)
Publication date :
2023-10-25
ISSN :
1944-8244
English keyword(s) :
ferroelectric organic
poly(vinylidene fluoride-co-trifluoroethylene)
polar axis
edge-on lamella
nanoscale
piezoresponse force microscopy
poly(vinylidene fluoride-co-trifluoroethylene)
polar axis
edge-on lamella
nanoscale
piezoresponse force microscopy
HAL domain(s) :
Chimie/Matériaux
Chimie/Polymères
Chimie/Polymères
English abstract : [en]
Ferroelectric poly(vinylidene fluoride-co-trifluoroethylene) [P(VDF-co-TrFE)] thin films have been deposited by spin-coating onto the Bi0.5Na0.5TiO3(BNT)/LNO/SiO2/Si heterostructure. The copolymer microstructure investigated ...
Show more >Ferroelectric poly(vinylidene fluoride-co-trifluoroethylene) [P(VDF-co-TrFE)] thin films have been deposited by spin-coating onto the Bi0.5Na0.5TiO3(BNT)/LNO/SiO2/Si heterostructure. The copolymer microstructure investigated by using grazing-incidence wide-angle X-ray diffraction (GIWAXD) and deduced from the (200)/(110) reflections demonstrates that the b-axis in the P(VDF-co-TrFE) orthorhombic unit cell is either in the plane or out of the plane, depending on the face-on or on the two types of edge-on (called I and II) lamellar structures locally identified by atomic force microscopy (AFM). For edge-on I lamellae regions, the electroactivity (dzzeff ∼ −50.3 pm/V) is found to be twice as high as that measured for both edge-on II or face-on crystalline domains, as probed by piezoresponse force microscopy (PFM). This result is directly correlated to the direction of the ferroelectric polarization vector in the P(VDF-co-TrFE) orthorhombic cell: larger nanoscale piezoactivity is related to the b-axis which lies along the normal to the substrate plane in the case of the edge-on I domains. Here, the ability to thoroughly gain access to the as-grown polar axis direction within the edge-on crystal lamellae of the ferroelectric organic layers is evidenced by combining the nanometric resolution of the PFM technique with a statistical approach based on its spectroscopic tool. By the gathering of information at the nanoscale, two orientations for the polar b-axis are identified in edge-on lamellar structures. These findings contribute to a better understanding of the structure–property relationships in P(VDF-co-TrFE) films, which is a key issue for the design of future advanced organic electronic devices.Show less >
Show more >Ferroelectric poly(vinylidene fluoride-co-trifluoroethylene) [P(VDF-co-TrFE)] thin films have been deposited by spin-coating onto the Bi0.5Na0.5TiO3(BNT)/LNO/SiO2/Si heterostructure. The copolymer microstructure investigated by using grazing-incidence wide-angle X-ray diffraction (GIWAXD) and deduced from the (200)/(110) reflections demonstrates that the b-axis in the P(VDF-co-TrFE) orthorhombic unit cell is either in the plane or out of the plane, depending on the face-on or on the two types of edge-on (called I and II) lamellar structures locally identified by atomic force microscopy (AFM). For edge-on I lamellae regions, the electroactivity (dzzeff ∼ −50.3 pm/V) is found to be twice as high as that measured for both edge-on II or face-on crystalline domains, as probed by piezoresponse force microscopy (PFM). This result is directly correlated to the direction of the ferroelectric polarization vector in the P(VDF-co-TrFE) orthorhombic cell: larger nanoscale piezoactivity is related to the b-axis which lies along the normal to the substrate plane in the case of the edge-on I domains. Here, the ability to thoroughly gain access to the as-grown polar axis direction within the edge-on crystal lamellae of the ferroelectric organic layers is evidenced by combining the nanometric resolution of the PFM technique with a statistical approach based on its spectroscopic tool. By the gathering of information at the nanoscale, two orientations for the polar b-axis are identified in edge-on lamellar structures. These findings contribute to a better understanding of the structure–property relationships in P(VDF-co-TrFE) films, which is a key issue for the design of future advanced organic electronic devices.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
ANR Project :
Administrative institution(s) :
Université de Lille
CNRS
INRAE
ENSCL
CNRS
INRAE
ENSCL
Collections :
Research team(s) :
Ingénierie des Systèmes Polymères
Couches minces & nanomatériaux (CMNM)
Couches minces & nanomatériaux (CMNM)
Submission date :
2023-11-10T06:54:35Z
2023-11-10T09:41:50Z
2023-11-10T11:18:43Z
2023-11-10T09:41:50Z
2023-11-10T11:18:43Z