PbZr0.52Ti0.48O3 and SrBi2Nb2O9 ferroelectric ...
Type de document :
Compte-rendu et recension critique d'ouvrage
DOI :
Titre :
PbZr0.52Ti0.48O3 and SrBi2Nb2O9 ferroelectric oxides integrated with YBa2Cu3O7 superconductor in multilayers epitaxially grown by pulsed laser deposition
Auteur(s) :
Duclere, Jean-René [Auteur]
Institut de Recherche sur les CERamiques [IRCER]
Guilloux-Viry, Maryline [Auteur]
Institut des Sciences Chimiques de Rennes [ISCR]
Perrin, A. [Auteur]
Université de Rennes [UR]
Centre National de la Recherche Scientifique [CNRS]
Soyer, Caroline [Auteur]
Cattan, Eric [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Remiens, Denis [Auteur]
Université de Valenciennes et du Hainaut-Cambrésis [UVHC]
Dauscher, A. [Auteur]
Laboratoire de physique des matériaux [LPM]
Weber, Sébastien J. [Auteur]
Laboratoire de physique des matériaux [LPM]
Lenoir, B. [Auteur]
Laboratoire de physique des matériaux [LPM]
Institut de Recherche sur les CERamiques [IRCER]
Guilloux-Viry, Maryline [Auteur]
Institut des Sciences Chimiques de Rennes [ISCR]
Perrin, A. [Auteur]
Université de Rennes [UR]
Centre National de la Recherche Scientifique [CNRS]
Soyer, Caroline [Auteur]
Cattan, Eric [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Remiens, Denis [Auteur]
Université de Valenciennes et du Hainaut-Cambrésis [UVHC]
Dauscher, A. [Auteur]
Laboratoire de physique des matériaux [LPM]
Weber, Sébastien J. [Auteur]
Laboratoire de physique des matériaux [LPM]
Lenoir, B. [Auteur]
Laboratoire de physique des matériaux [LPM]
Titre de la revue :
Journal de Physique IV Proceedings
International Conference on Thin Film Deposition of Oxide Multilayers Hybrid Structures
International Conference on Thin Film Deposition of Oxide Multilayers Hybrid Structures
Pagination :
29-33
Éditeur :
EDP Sciences
Date de publication :
2001
ISSN :
1155-4339
Discipline(s) HAL :
Sciences de l'ingénieur [physics]/Matériaux
Résumé en anglais : [en]
Multilayers of PbZr0.52Ti0.48O3 (PZT) or SrBi2Nb2O9 (SBN) ferroelectrics (F) and YBa2Cu3O7 (YBaCuO) superconductor (S) have been grown by pulsed laser deposition. F/S or S/F bilayers as well as S/F/S trilayers deposited ...
Lire la suite >Multilayers of PbZr0.52Ti0.48O3 (PZT) or SrBi2Nb2O9 (SBN) ferroelectrics (F) and YBa2Cu3O7 (YBaCuO) superconductor (S) have been grown by pulsed laser deposition. F/S or S/F bilayers as well as S/F/S trilayers deposited on SrTiO3 and MgO were epitaxially grown, as evidenced by x-ray diffraction (XRD) inθ -2θ and φ-scans modes, reflection high energy electron diffraction (RHEED) or electron channeling patterns (ECP). Superconducting YBaCuO films deposited on PZT exhibit a critical temperature, Tc, of about 86 K slightly below the value routinely obtained in the same deposition conditions on bare (100)SrTiO3 substrate (typically 88-89 K). By contrast, the Tc of YBaCuO films on SBN, either on (100)SrTiO3 or on (100)MgO is close to 88-89 K suggesting that SBN can be a good candidate as ferroelectric buffer layer for the growth of YBaCuO, especially on MgO for which a graphoepitaxial mechanism tends to limit the YBaCuO growth quality. In the case of F/S layers, hysteresis loops of PZT on YBaCuO show a saturated polarization larger than 30 µC/cm2 and a coercive field of about 70 kV/cm. Secondary ion mass spectrometry (SIMS) experiments have been performed in order to correlate interdiffusion mechanisms with both structural data and physical properties.Lire moins >
Lire la suite >Multilayers of PbZr0.52Ti0.48O3 (PZT) or SrBi2Nb2O9 (SBN) ferroelectrics (F) and YBa2Cu3O7 (YBaCuO) superconductor (S) have been grown by pulsed laser deposition. F/S or S/F bilayers as well as S/F/S trilayers deposited on SrTiO3 and MgO were epitaxially grown, as evidenced by x-ray diffraction (XRD) inθ -2θ and φ-scans modes, reflection high energy electron diffraction (RHEED) or electron channeling patterns (ECP). Superconducting YBaCuO films deposited on PZT exhibit a critical temperature, Tc, of about 86 K slightly below the value routinely obtained in the same deposition conditions on bare (100)SrTiO3 substrate (typically 88-89 K). By contrast, the Tc of YBaCuO films on SBN, either on (100)SrTiO3 or on (100)MgO is close to 88-89 K suggesting that SBN can be a good candidate as ferroelectric buffer layer for the growth of YBaCuO, especially on MgO for which a graphoepitaxial mechanism tends to limit the YBaCuO growth quality. In the case of F/S layers, hysteresis loops of PZT on YBaCuO show a saturated polarization larger than 30 µC/cm2 and a coercive field of about 70 kV/cm. Secondary ion mass spectrometry (SIMS) experiments have been performed in order to correlate interdiffusion mechanisms with both structural data and physical properties.Lire moins >
Langue :
Anglais
Vulgarisation :
Non
Source :
Fichiers
- https://hal.archives-ouvertes.fr/hal-00152480/document
- Accès libre
- Accéder au document
- https://hal.archives-ouvertes.fr/hal-00152480/document
- Accès libre
- Accéder au document
- Duclere2001.pdf
- Accès libre
- Accéder au document
- document
- Accès libre
- Accéder au document