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Affirming nonlinear optical coefficient ...
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Document type :
Article dans une revue scientifique
DOI :
10.3788/COL202018.071903
Title :
Affirming nonlinear optical coefficient constancy from z-scan measurement
Author(s) :
Hua, Shijia [Auteur]
Du, Kang [Auteur]
Wang, Heng [Auteur]
Zhang, Wending [Auteur]
Mei, Ting []
Dogheche, El Hadj [Auteur]
Optoélectronique - IEMN [OPTO - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Journal title :
Chinese Optics Letters
Pages :
071903, 5 pages
Publisher :
Optical Society of America (imprimé) / OSA publishing (en ligne)
Publication date :
2020-07-10
ISSN :
1671-7694
English keyword(s) :
z-scan technique
nonlinear refraction and absorption
nonlinear optical coefficient
carbon disulfide
HAL domain(s) :
Sciences de l'ingénieur [physics]
Sciences de l'ingénieur [physics]/Acoustique [physics.class-ph]
Sciences de l'ingénieur [physics]/Optique / photonique
English abstract : [en]
Goodness of fit is demonstrated for theoretical calculation of z-scan data based on beams propagating in the nonlinear medium and the Fresnel-Kirchhoff diffraction integral in experiments with high nonlinear refraction and ...
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Goodness of fit is demonstrated for theoretical calculation of z-scan data based on beams propagating in the nonlinear medium and the Fresnel-Kirchhoff diffraction integral in experiments with high nonlinear refraction and absorption. The constancy of nonlinear optical parameters is achieved regardless of sample thickness and laser intensity, which clarifies the physical significance of optical parameters. We have obtained gamma = 2.0 x 10(-19) m(2)/W and beta = 5.0 x 10(-13) m/W for carbon disulfide excited by a pulsed laser at 800 nm with pulse duration of 35 fs, which are independent of sample thickness and laser intensity. Affirming constancy of the extracted parameters to the incident light intensity may become a practice to verify the goodness of the z-scan experiment.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
Collections :
  • Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
Source :
Harvested from HAL
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