A memory reliability enhancement technique ...
Document type :
Compte-rendu et recension critique d'ouvrage
Title :
A memory reliability enhancement technique for multi bit upsets
Author(s) :
Chabot, Alexandre [Auteur correspondant]
Laboratoire d'Automatique, de Mécanique et d'Informatique industrielles et Humaines - UMR 8201 [LAMIH]
Commissariat à l'énergie atomique et aux énergies alternatives [CEA]
Alouani, Lihsen [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
COMmunications NUMériques - IEMN [COMNUM - IEMN]
Nouacer, Reda [Auteur]
Commissariat à l'énergie atomique et aux énergies alternatives [CEA]
Niar, Smail [Auteur]
Laboratoire d'Automatique, de Mécanique et d'Informatique industrielles et Humaines - UMR 8201 [LAMIH]
Laboratoire d'Automatique, de Mécanique et d'Informatique industrielles et Humaines - UMR 8201 [LAMIH]
Commissariat à l'énergie atomique et aux énergies alternatives [CEA]
Alouani, Lihsen [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
COMmunications NUMériques - IEMN [COMNUM - IEMN]
Nouacer, Reda [Auteur]
Commissariat à l'énergie atomique et aux énergies alternatives [CEA]
Niar, Smail [Auteur]
Laboratoire d'Automatique, de Mécanique et d'Informatique industrielles et Humaines - UMR 8201 [LAMIH]
Journal title :
Journal of Signal Processing Systems
Pages :
439-459
Publisher :
Springer
Publication date :
2021-04
ISSN :
1939-8018
English keyword(s) :
Reliability
MBU
Fault injection
Memory
MBU
Fault injection
Memory
HAL domain(s) :
Sciences de l'ingénieur [physics]
Informatique [cs]
Informatique [cs]/Réseaux et télécommunications [cs.NI]
Informatique [cs]/Intelligence artificielle [cs.AI]
Sciences de l'ingénieur [physics]/Traitement du signal et de l'image [eess.SP]
Sciences de l'ingénieur [physics]/Electronique
Informatique [cs]
Informatique [cs]/Réseaux et télécommunications [cs.NI]
Informatique [cs]/Intelligence artificielle [cs.AI]
Sciences de l'ingénieur [physics]/Traitement du signal et de l'image [eess.SP]
Sciences de l'ingénieur [physics]/Electronique
English abstract : [en]
Technological advances allow the production of increasingly complex electronic systems. Nevertheless, technology and voltage scaling increased dramatically the susceptibility of new devices not only to Single Bit Upsets ...
Show more >Technological advances allow the production of increasingly complex electronic systems. Nevertheless, technology and voltage scaling increased dramatically the susceptibility of new devices not only to Single Bit Upsets (SBU), but also to Multiple Bit Upsets (MBU). In safety critical applications, it is mandatory to provide fault-tolerant systems, providing high reliability while meeting applications requirements. The problem of reliability is particularly expressed within the memory which represents more than 80 % of systems on chips. To tackle this problem we propose a new memory reliability techniques referred to as DPSR: Double Parity Single Redundancy. DPSR is designed to enhance computing systems resilience to SBU and MBU. Based on a thorough fault injection experiments, DPSR shows promising results; It detects and corrects more than 99.6 % of encountered MBU and has an average time overhead of less than 3 %.Show less >
Show more >Technological advances allow the production of increasingly complex electronic systems. Nevertheless, technology and voltage scaling increased dramatically the susceptibility of new devices not only to Single Bit Upsets (SBU), but also to Multiple Bit Upsets (MBU). In safety critical applications, it is mandatory to provide fault-tolerant systems, providing high reliability while meeting applications requirements. The problem of reliability is particularly expressed within the memory which represents more than 80 % of systems on chips. To tackle this problem we propose a new memory reliability techniques referred to as DPSR: Double Parity Single Redundancy. DPSR is designed to enhance computing systems resilience to SBU and MBU. Based on a thorough fault injection experiments, DPSR shows promising results; It detects and corrects more than 99.6 % of encountered MBU and has an average time overhead of less than 3 %.Show less >
Language :
Anglais
Popular science :
Non
Source :