Titre :

Structural determination of bilayer graphene on SiC(0001) using synchrotron radiation photoelectron diffraction

Auteur(s) :

Razado-Colambo, I. [Auteur]
Synchrotron SOLEIL [SSOLEIL]
Avila, J. [Auteur]
Synchrotron SOLEIL [SSOLEIL]
Vignaud, Dominique [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
EPItaxie et PHYsique des hétérostructures - IEMN [EPIPHY - IEMN]
Godey, Sylvie [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Wallart, Xavier [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
EPItaxie et PHYsique des hétérostructures - IEMN [EPIPHY - IEMN]
Woodruff, D [Auteur]
University of Warwick [Coventry]
Asensio, M.C. [Auteur]
Synchrotron SOLEIL [SSOLEIL]

Titre de la revue :

Scientific Reports

Pagination :

10190

Éditeur :

Nature Publishing Group

Date de publication :

2018

ISSN :

2045-2322

Discipline(s) HAL :

Physique [physics]/Matière Condensée [cond-mat]/Science des matériaux [cond-mat.mtrl-sci]

Résumé en anglais : [en]

In recent years there has been growing interest in the electronic properties of ‘few layer’ graphene films. Twisted layers, different stacking and register with the substrate result in remarkable unconventional couplings. ...
Lire la suite >In recent years there has been growing interest in the electronic properties of ‘few layer’ graphene films. Twisted layers, different stacking and register with the substrate result in remarkable unconventional couplings. These distinctive electronic behaviours have been attributed to structural differences, even if only a few structural determinations are available. Here we report the results of a structural study of bilayer graphene on the Si-terminated SiC(0001) surface, investigated using synchrotron radiation-based photoelectron diffraction and complemented by angle-resolved photoemission mapping of the electronic valence bands. Photoelectron diffraction angular distributions of the graphene C 1s component have been measured at different kinetic energies and compared with the results of multiple scattering simulations for model structures. The results confirm that bilayer graphene on SiC(0001) has a layer spacing of 3.48 Å and an AB (Bernal) stacking, with a distance between the C buffer layer and the first graphene layer of 3.24 Å. Our work generalises the use of a versatile and precise diffraction method capable to shed light on the structure of low-dimensional materials.Lire moins >

Langue :

Anglais

Vulgarisation :

Non

Projet ANR :

Caractérisations AvancéeS in SItu / OPerando de micro-batteriES 3D tout solide à ions lithium développées en technologie couche mince ALD

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL