Title :

Signal estimation and uncertainties extraction in TeraHertz Time Domain Spectroscopy

Author(s) :

Denakpo, Elsa [Auteur]
Hannotte, Théo [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Photonique THz - IEMN [PHOTONIQUE THZ - IEMN]
Osseiran, Noureddin [Auteur]
Orieux, François [Auteur]
Université Paris-Saclay
Laboratoire des signaux et systèmes [L2S]
Peretti, Romain [Auteur]
Photonique THz - IEMN [PHOTONIQUE THZ - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

English keyword(s) :

time domain spectroscopy signal processing terahertz (THz) noise extraction covariance inverse estimation
time domain spectroscopy
signal processing
terahertz (THz)
noise extraction
covariance inverse estimation

HAL domain(s) :

Physique [physics]/Physique [physics]/Optique [physics.optics]

English abstract : [en]

<div><p>Terahertz Time Domain Spectroscopy (THz-TDS) systems have emerged as mature technologies with significant potential across various research fields and industries. However, the lack of standardized methods for signal ...
Show more ><div><p>Terahertz Time Domain Spectroscopy (THz-TDS) systems have emerged as mature technologies with significant potential across various research fields and industries. However, the lack of standardized methods for signal and noise estimation and reduction hinders its full potential. This paper introduces a methodology to significantly reduce noise in THz-TDS time traces, providing a reliable and less biased estimation of the signal. The method results in an improved signal-to-noise ratio, enabling the utilization of the full dynamic range of such setups. Additionally, we investigate the estimation of the covariance matrix to quantify the uncertainties associated with the signal estimator. This matrix is essential for extracting accurate material parameters by normalizing the error function in the fitting process. Our approach addresses practical scenarios where the number of repeated measurements is limited compared to the sampling time axis length. We envision this work as the initial step toward standardizing THz-TDS data processing. We believe it will foster collaboration between the THz and signal processing communities, leading to the development of more sophisticated methods to tackle new challenges introduced by novel setups based on optoelectronic devices and dual-comb spectroscopy.</p></div>Show less >

Language :

Anglais

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL