Titre :

Automatised selection of load paths to construct reduced-order models in computational damage micromechanics: from dissipation-driven random selection to Bayesian optimization

Auteur(s) :

Goury, Olivier [Auteur]
Deformable Robots Simulation Team [DEFROST ]
Amsallem, David [Auteur]
Stanford University
Bordas, Stéphane Pierre-Alain [Auteur]
Université du Luxembourg = University of Luxembourg = Universität Luxemburg [uni.lu]
Liu, Wing Kam [Auteur]
Northwestern University [Evanston]
Kerfriden, Pierre [Auteur correspondant]
Cardiff School of Engineering

Titre de la revue :

Computational Mechanics

Pagination :

213–234

Éditeur :

Springer Verlag

Date de publication :

2016-08

ISSN :

0178-7675

Mot(s)-clé(s) en anglais :

damage mechanics
multiscale
Hyperreduction
model order reduction
computational homogenisation
reduced basis

Discipline(s) HAL :

Physique [physics]/Mécanique [physics]/Mécanique des structures [physics.class-ph]

Résumé en anglais : [en]

In this paper, we present new reliable model order reduction strategies for computational micromechanics. The difficulties rely mainly upon the high dimensionality of the parameter space represented by any load path applied ...
Lire la suite >In this paper, we present new reliable model order reduction strategies for computational micromechanics. The difficulties rely mainly upon the high dimensionality of the parameter space represented by any load path applied onto the representative volume element (RVE). We take special care of the challenge of selecting an exhaustive snapshot set. This is treated by first using a random sampling of energy dissipating load paths and then in a more advanced way using Bayesian optimization associated with an interlocked division of the parameter space. Results show that we can insure the selection of an exhaustive snapshot set from which a reliable reduced-order model (ROM) can be built.Lire moins >

Langue :

Anglais

Comité de lecture :

Oui

Audience :

Internationale

Vulgarisation :

Non

Collections :

• Centre de Recherche en Informatique, Signal et Automatique de Lille (CRIStAL) - UMR 9189

Source :

Harvested from HAL