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Dielectric characterization in a broad frequency and temperature range of SrBi2Nb2O9 thin films grown on Pt electrodes
Journal of Applied Physics, American Institute of Physics, 2005, 97, 114102-1-7Compte-rendu et recension critique d'ouvragetexte intégral -
Dielectric microwave characterizations of (Ba,Sr)TiO3 film deposited on high resistivity silicon substrate : analysis by two-dimensional tangential finite element method
Journal of Applied Physics, American Institute of Physics, 2010, 107, 054112-1-5Compte-rendu et recension critique d'ouvragetexte intégral -
Interface depolarization field as common denominator of fatigue and size effect in Pb(Zr0.54Ti0.46)O3 ferroelectric thin film capacitors
Journal of Applied Physics, American Institute of Physics, 2010, 107, 104102-1-9Compte-rendu et recension critique d'ouvragetexte intégral -
Analysis of size effects in Pb(Zr0.54Ti0.46)O3 thin film capacitors with platinum and LaNiO3 conducting oxide electrodes
Journal of Applied Physics, American Institute of Physics, 2009, 106; 4, 044101Compte-rendu et recension critique d'ouvragetexte intégral -
Analysis of the degradation induced by focused ion Ga3+ beam for the realization of piezoelectric nanostructures
Journal of Applied Physics, American Institute of Physics, 2010, 108; 4, 0420084Compte-rendu et recension critique d'ouvragetexte intégral -
Electrical damage induced by reactive ion-beam etching of lead-zirconate-titanate thin films
Journal of Applied Physics, American Institute of Physics, 2005, 97; 11, 114110Compte-rendu et recension critique d'ouvragetexte intégral -
Enhancement in nanoscale electrical properties of lead zirconic titanate island fabricated by focused ion beam
Journal of Applied Physics, American Institute of Physics, 2009, 105; 4, 044101Compte-rendu et recension critique d'ouvragetexte intégral -
Top electrode size effect on hysteresis loops in piezoresponse force microscopy ofPb(Zr,Ti)O3-film on silicon structures
Journal of Applied Physics, American Institute of Physics, 2012, 112, 052015-1-7Compte-rendu et recension critique d'ouvragetexte intégral