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Setting parameters influence on accuracy and stability of near-field scanning microwave microscopy platform
IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 04-2016, 65; 4, 890-897Compte-rendu et recension critique d'ouvrage -
Scanning microwave near-field microscope based on the multiport technology
IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2013, 62, 3189-3193Compte-rendu et recension critique d'ouvrage