Molecular beam epitaxial growth of hexagonal ...
Document type :
Compte-rendu et recension critique d'ouvrage
DOI :
Title :
Molecular beam epitaxial growth of hexagonal boron nitride on Ni foils
Author(s) :
Hadid, Jawad [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Colambo, Ivy [Auteur]
Boyaval, Christophe [Auteur]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Nuns, Nicolas [Auteur]
Institut Michel Eugène Chevreul - FR 2638 [IMEC]
Dudin, Pavel [Auteur]
Synchrotron SOLEIL [SSOLEIL]
Avila, Jose [Auteur]
Synchrotron SOLEIL [SSOLEIL]
Wallart, Xavier [Auteur]
EPItaxie et PHYsique des hétérostructures - IEMN [EPIPHY - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Vignaud, Dominique [Auteur]
EPItaxie et PHYsique des hétérostructures - IEMN [EPIPHY - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Colambo, Ivy [Auteur]
Boyaval, Christophe [Auteur]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Nuns, Nicolas [Auteur]
Institut Michel Eugène Chevreul - FR 2638 [IMEC]
Dudin, Pavel [Auteur]
Synchrotron SOLEIL [SSOLEIL]
Avila, Jose [Auteur]
Synchrotron SOLEIL [SSOLEIL]
Wallart, Xavier [Auteur]

EPItaxie et PHYsique des hétérostructures - IEMN [EPIPHY - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Vignaud, Dominique [Auteur]

EPItaxie et PHYsique des hétérostructures - IEMN [EPIPHY - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Journal title :
2D Materials
Pages :
045007
Publisher :
IOP Publishing
Publication date :
2021-07-15
ISSN :
2053-1583
English keyword(s) :
hexagonal boron nitride
molecular beam epitaxy
photoemission spectroscopy
molecular beam epitaxy
photoemission spectroscopy
HAL domain(s) :
Sciences de l'ingénieur [physics]/Matériaux
Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique
Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique
English abstract : [en]
Hexagonal boron nitride was synthesized by molecular beam epitaxy on polycrystalline Ni foils using borazine (B 3 N 3 H 6) as precursor. Our photoemission analysis shows that several components of boron and nitrogen are ...
Show more >Hexagonal boron nitride was synthesized by molecular beam epitaxy on polycrystalline Ni foils using borazine (B 3 N 3 H 6) as precursor. Our photoemission analysis shows that several components of boron and nitrogen are detected, suggesting the complex nature of the bonds noticeably at the h-BN/Ni interface. The BN thickness was estimated by photoemission and the BN distribution by ToF-SIMS. Due to the catalytic effect of the Ni substrate, this thickness is self-limited in the range 1-2 layers regardless of the borazine dose. A spatially resolved photoemission study was carried out before and after transfer of the h-BN on a Si substrate. It shows that a strong electronic coupling exists at the interface between h-BN and polycrystalline Ni, not only for (111) grains, which disappears after transfer on Si. In addition, we highlight the importance of detecting π plasmons in the photoemission spectra to confirm the hexagonal nature of boron nitride.Show less >
Show more >Hexagonal boron nitride was synthesized by molecular beam epitaxy on polycrystalline Ni foils using borazine (B 3 N 3 H 6) as precursor. Our photoemission analysis shows that several components of boron and nitrogen are detected, suggesting the complex nature of the bonds noticeably at the h-BN/Ni interface. The BN thickness was estimated by photoemission and the BN distribution by ToF-SIMS. Due to the catalytic effect of the Ni substrate, this thickness is self-limited in the range 1-2 layers regardless of the borazine dose. A spatially resolved photoemission study was carried out before and after transfer of the h-BN on a Si substrate. It shows that a strong electronic coupling exists at the interface between h-BN and polycrystalline Ni, not only for (111) grains, which disappears after transfer on Si. In addition, we highlight the importance of detecting π plasmons in the photoemission spectra to confirm the hexagonal nature of boron nitride.Show less >
Language :
Anglais
Popular science :
Non
Source :
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