Title :

Optimization of surface treatment on MEMS probes for single-cell capture and release

Author(s) :

Hayashi, Kensaku [Auteur]
Tokyo City University
Kumemura, Momoko [Auteur]
The University of Tokyo [UTokyo]
Kaneda, Shohei [Auteur]
The University of Tokyo [UTokyo]
Menon, Vivek [Auteur]
The University of Tokyo [UTokyo]
Jalabert, Laurent [Auteur]
Laboratory for Integrated Micro Mechatronics Systems [LIMMS]
Tachikawa, Saeko [Auteur]
The University of Tokyo [UTokyo]
Tarhan, Mehmet [Auteur]
Bio-Micro-Electro-Mechanical Systems - IEMN [BIOMEMS - IEMN]
Yncréa Hauts-de-France
Fujii, Teruo [Auteur]
The University of Tokyo [UTokyo]
Kim, Beomjoon [Auteur]
The University of Tokyo [UTokyo]
Fujita, Hiroyuki [Auteur]
The University of Tokyo [UTokyo]

Journal title :

Sensors and Materials

Pages :

2873

Publisher :

Myu scientific publishing

Publication date :

2019

ISSN :

0914-4935

English keyword(s) :

MEMS tweezers
cell handling
single-cell trapping
surface modification
surface treatment

HAL domain(s) :

Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

English abstract : [en]

Micro-electromechanical systems (MEMS) tweezers developed for the trapping and characterization of bio molecules such as DNA are also capable of cell handling, which will enable further application involving single cell ...
Show more >Micro-electromechanical systems (MEMS) tweezers developed for the trapping and characterization of bio molecules such as DNA are also capable of cell handling, which will enable further application involving single cell characterization. However, cellular adhesion to Si tweezers surfaces can inhibit the release of cells after capture and analysis. To allow for high-throughput cell handling, the surface modification process for probe sidewalls was optimized. The hydrophilicity of sample silicon wafers modified with various chemical coatings was measured to identify the optimal process. The surface modification was then applied to MEMS probes and the feasibility of cell capture/release was evaluated.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL