Titre :

Joint interference cancellation for multi-carrier modulation-based non-orthogonal multiple access

Auteur(s) :

SAIDEH, Michel [Auteur]
Laboratoire Électronique Ondes et Signaux pour les Transports [IFSTTAR/COSYS/LEOST]
Alsaba, Yamen [Auteur]
Dayoub, Iyad [Auteur]
COMmunications NUMériques - IEMN [COMNUM - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Berbineau, Marion [Auteur]
Laboratoire Électronique Ondes et Signaux pour les Transports [IFSTTAR/COSYS/LEOST]

Éditeur :

Institute of Electrical and Electronics Engineers

Date de publication :

2019-11

Mot(s)-clé(s) en anglais :

Non-orthogonal multiple access
multi-carrier modulation
imperfect successive interference cancellation
NOMA
Image edge detection
OFDM
Interference cancellation
Silicon carbide
Equalizers

Discipline(s) HAL :

Sciences de l'ingénieur [physics]

Résumé en anglais : [en]

This letter considers the implementation of Non-Orthogonal Multiple Access (NOMA) scheme with different waveforms. The performance of the adopted Multi-Carrier Modulations (MCM)-based NOMA system is evaluated in doubly ...
Lire la suite >This letter considers the implementation of Non-Orthogonal Multiple Access (NOMA) scheme with different waveforms. The performance of the adopted Multi-Carrier Modulations (MCM)-based NOMA system is evaluated in doubly selective channel scenario. In addition, the imperfect Successive Interference Cancellation (SIC) process is analyzed, wherein a joint iterative algorithm is introduced. The proposed algorithm cancels both weaker users interference signal and the non diagonality of the MCM System Transmission Matrix (STM) resulted from imperfect Successive Interference Cancellation (SIC) and the doubly selectivity, respectively. Furthermore, numerical simulations are performed to prove the efficiency of the introduced joint technique when compared to the theoretical perfect SIC case.Lire moins >

Langue :

Anglais

Comité de lecture :

Oui

Audience :

Internationale

Vulgarisation :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL

Date de dépôt :

2021-07-27T08:00:05Z