Titre :

Exploring the capabilities of scanning microwave microscopy to characterize semiconducting polymers

Auteur(s) :

Douhéret, Olivier [Auteur]
Théron, Didier [Auteur]
Nano and Microsystems - IEMN [NAM6 - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Moerman, David [Auteur]

Titre de la revue :

Applied Sciences

Pagination :

8234, 11 pages

Éditeur :

Multidisciplinary digital publishing institute (MDPI)

Date de publication :

2020-11-20

ISSN :

2076-3417

Mot(s)-clé(s) en anglais :

scanning microwave microscopy
organic photovoltaics
charge transport
Mach-Zehnder interferometer detection unit

Discipline(s) HAL :

Sciences de l'ingénieur [physics]/Matériaux
Sciences de l'ingénieur [physics]

Résumé en anglais : [en]

Standing at the meeting between solid state physics and optical spectroscopy, microwave characterization methods are efficient methods to probe electronic mechanisms and mesoscopic transport in semiconducting polymers. ...
Lire la suite >Standing at the meeting between solid state physics and optical spectroscopy, microwave characterization methods are efficient methods to probe electronic mechanisms and mesoscopic transport in semiconducting polymers. Scanning microwave microscopy, augmented with a Mach-Zehnder interferometer detection unit to allow for the probing of high impedance structures was applied on poly(3-hexylthiophene-2,5-diy) and exhibited high sensitivity while operating at the nanoscale. Provided a well-defined experiment protocol, S 11 phase and amplitude signals are shown to lead simultaneously yet independently to probing the variations of the dielectric properties in the materials, i.e., conductive and capacitive properties, respectively, upon applied DC gate bias. Adjusting the operating microwave frequency can also serve to probe carrier trapping mechanisms.Lire moins >

Langue :

Anglais

Vulgarisation :

Non

Projet ANR :

Centre expérimental pour l'étude des propriétés des nanodispositifs dans un large spectre du DC au moyen Infra-rouge.

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL