Title :

Broadband microwave interferometry for non destructive evaluation

Author(s) :

Haddadi, Kamel [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Lasri, Tuami [Auteur]
Microtechnology and Instrumentation for Thermal and Electromagnetic Characterization - IEMN [MITEC - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Conference title :

13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII

City :

Le Mans

Country :

France

Start date of the conference :

2013

Book title :

Proceedings of 13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII

Publication date :

2013

English keyword(s) :

near-field microwave microscopy
evanescent probe
interferometry
nondestructive testing

HAL domain(s) :

Sciences de l'ingénieur [physics]

English abstract : [en]

A broadband microwave interferometric technique for scanning near-field microscopy applications is proposed. The method is based on the association of a vector network analyzer, a hybrid coupler, an evanescent microwave ...
Show more >A broadband microwave interferometric technique for scanning near-field microscopy applications is proposed. The method is based on the association of a vector network analyzer, a hybrid coupler, an evanescent microwave coaxial probe and a precise impedance tuner built up with a high precision programmable delay line and a variable motor-driven attenuator. Advantages such as simplicity of operation, broad frequency band capabilities and high measurement sensitivity are achieved. In particular, the measurement sensitivity, the depth and lateral resolutions of the microwave microscope are experimentally verified to evaluate the performances of the system. The usefulness and versatility of the method make it also suited for a wide range of applications.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Non spécifiée

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL