Title :

Interferometer-based microwave microscopy operating in transmission mode

Author(s) :

Haddadi, Kamel [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Lasri, Tuami [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Journal title :

IEEE Sensors Journal

Pages :

2226-2227

Publisher :

Institute of Electrical and Electronics Engineers

Publication date :

2014

ISSN :

1530-437X

English keyword(s) :

near-field microwave microscopy
evanescent probe
high impedance
interferometry
local characterization

English abstract : [en]

A microwave near-field sensing technique with sub-wavelength resolution is proposed for nondestructive local characterization of materials. The method is based on the measurement of a transmission coefficient by means of ...
Show more >A microwave near-field sensing technique with sub-wavelength resolution is proposed for nondestructive local characterization of materials. The method is based on the measurement of a transmission coefficient by means of an association of a vector network analyzer, a hybrid coupler, an evanescent microwave coaxial probe, and an impedance tuner built up with a high precision programmable delay line and a variable motor-driven attenuator. Simplicity of operation and tuning possibility of the measurement sensitivity in the presence of the material under investigation are competitive advantages of the method. The depth and lateral resolutions of the microscope are experimentally verified.Show less >

Language :

Anglais

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL