Synthesis and characterization of BNT thin films
Document type :
Communication dans un congrès avec actes
Title :
Synthesis and characterization of BNT thin films
Author(s) :
Abou Dargham, Sara [Auteur]
Jabbour, Jihane [Auteur]
Zaatar, Youssef [Auteur]
Assaad, Jamal [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Khoury, Antonio [Auteur]
Remiens, Denis [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Zaouk, Doumit [Auteur]
Jabbour, Jihane [Auteur]
Zaatar, Youssef [Auteur]
Assaad, Jamal [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Khoury, Antonio [Auteur]
Remiens, Denis [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Zaouk, Doumit [Auteur]
Conference title :
Lebanese Association for the Advancement of Science 20th International Science Conference, LAAS 20
City :
Hadath
Country :
Liban
Start date of the conference :
2014
Book title :
Proceedings of Lebanese Association for the Advancement of Science 20th International Science Conference, LAAS 20
Publication date :
2014
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
Polycrystalline piezoelectric lead-free Bi0.5Na0.5TiO3 (abbreviated as BNT) thin films were deposited on glass substrates by an optimized Sol-Gel process using the Electrospray technique. X-ray Diffraction (XRD) analysis ...
Show more >Polycrystalline piezoelectric lead-free Bi0.5Na0.5TiO3 (abbreviated as BNT) thin films were deposited on glass substrates by an optimized Sol-Gel process using the Electrospray technique. X-ray Diffraction (XRD) analysis showed that after heating the films at 650˚C for 1 hour, dense and well crystallized BNT films in the rhombohedral perovskite phase were formed. Polyhedral shaped primary particles, with an average size of approximately 200 nm and a smooth surface of 1.8 nm average roughness (Ra), were detected using AFM analysis. The deconvolution of Raman spectrum had confirmed our first results of XRD about the crystallization of BNT films due to the appearance of Raman peaks corresponding to the bending vibrations of Bi-O, Na-O and TiO6 bonds.Show less >
Show more >Polycrystalline piezoelectric lead-free Bi0.5Na0.5TiO3 (abbreviated as BNT) thin films were deposited on glass substrates by an optimized Sol-Gel process using the Electrospray technique. X-ray Diffraction (XRD) analysis showed that after heating the films at 650˚C for 1 hour, dense and well crystallized BNT films in the rhombohedral perovskite phase were formed. Polyhedral shaped primary particles, with an average size of approximately 200 nm and a smooth surface of 1.8 nm average roughness (Ra), were detected using AFM analysis. The deconvolution of Raman spectrum had confirmed our first results of XRD about the crystallization of BNT films due to the appearance of Raman peaks corresponding to the bending vibrations of Bi-O, Na-O and TiO6 bonds.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Non spécifiée
Popular science :
Non
Source :