Title :

Characterisation of surface residual stress using high frequency Rayleigh waves

Author(s) :

Ouaftouch, Mohammadi [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Duquennoy, Marc [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Deboucq, Julien [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Jenot, Frederic [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Ourak, Mohamed [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Conference title :

13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII

City :

Le Mans

Country :

France

Start date of the conference :

2013

Book title :

Proceedings of 13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII

Publication date :

2013

English keyword(s) :

Surface acoustic wave
IDT sensor
residual stress
characterisation

English abstract : [en]

In order to control residual stress distribution in glass, techniques based on the phenomenon of photoelasticity are efficient, though subject to the inherent limitations of all optical techniques. To mitigate these ...
Show more >In order to control residual stress distribution in glass, techniques based on the phenomenon of photoelasticity are efficient, though subject to the inherent limitations of all optical techniques. To mitigate these limitations, we exploit the phenomenon of acoustoelasticity to estimate residual stress distribution, using surface acoustic waves. In this study, we characterize the surface residual stresses using high frequency Rayleigh waves. From the dispersion of surface waves caused by the presence of residual stress fields, we estimate, by inverse method, the characteristics of residual stress distribution. SAW-IDT sensors are used to generate the quasi-monochromatic Rayleigh waves and the detection of these waves is obtained with interferometer probe.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Non spécifiée

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL