Titre :

Dispersion characteristic of ultrathin terahertz planar lenses based on metasurface

Auteur(s) :

Hu, Dan [Auteur]
Moreno, Gabriel [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Wang, Xinke [Auteur]
He, Jingwen [Auteur]
Chahadih, Abdallah [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Xie, Zhenwei [Auteur]
Wang, Bo [Auteur]
Akalin, Tahsin [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Zhang, Yan [Auteur]

Titre de la revue :

Optics Communications

Pagination :

164-168

Éditeur :

Elsevier

Date de publication :

2014

ISSN :

0030-4018

Résumé en anglais : [en]

Terahertz (THz) radiation has attached a lot of attention due to its potential applications. The smart optical components will greatly boost the application of the THz technology. Ultrathin planar lenses which can greatly ...
Lire la suite >Terahertz (THz) radiation has attached a lot of attention due to its potential applications. The smart optical components will greatly boost the application of the THz technology. Ultrathin planar lenses which can greatly reduce the thickness of the components are designed and fabricated in the THz region based on the metasurface. The dispersion characteristic of this kind of ultrathin planar lenses is systematically investigated. It is demonstrated that the focal lengths of the proposed lenses become shorter with the wavelength of the illuminating light increasing. Moreover, the ultrathin planar lenses perform a good focusing characteristic over a broad wavelength range. The results help us to further understand the optical properties of the lenses based on the metasurface and provide a considerable important reference for its future applications in miniaturization and integration of the THz system. Copyright © 2014 Published by Elsevier B.V.Lire moins >

Langue :

Anglais

Vulgarisation :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL