Titre :

Hybrid polyaniline/nanomagnetic particles composites : high performance materials for EMI shielding

Auteur(s) :

El Kamchi, N. [Auteur]
Belaabed, B. [Auteur]
Wojkiewicz, J.L. [Auteur]
Lamouri, S. [Auteur]
Lasri, Tuami [Auteur]
Microtechnology and Instrumentation for Thermal and Electromagnetic Characterization - IEMN [MITEC - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Titre de la revue :

Journal of Applied Polymer Science

Pagination :

4426-4432

Éditeur :

Wiley

Date de publication :

2013

ISSN :

0021-8995

Discipline(s) HAL :

Sciences de l'ingénieur [physics]

Résumé en anglais : [en]

In this work, two types of hybrid composite materials were elaborated. The first based on polyaniline (PANI) doped Camphor Sulfonic acid (CSA), Carbon-Coated Cobalt (CCo), and FeNi nanoparticles dispersed in polyurethane. ...
Lire la suite >In this work, two types of hybrid composite materials were elaborated. The first based on polyaniline (PANI) doped Camphor Sulfonic acid (CSA), Carbon-Coated Cobalt (CCo), and FeNi nanoparticles dispersed in polyurethane. A value of 104 S/m of conductivity and a 90 dB of shielding effectiveness in multilayer structure were obtained over the 8–18 GHz frequency band. The second type, based on PANI doped para-toluene sulfonic acid (PTSA), dispersed in epoxy resin with FeNi nanoparticles. A thick material with moderate conductivity and high attenuation of electromagnetic waves was obtained. It was found that a PANI-PTSA/FeNi/epoxy resin composite with thicknesses of 9.7 and 6.5 mm had, respectively, reflection loss values of −22 dB at 9.52 GHz, and −20.7 dB at 14.7 GHz. The electromagnetic properties of the elaborated structure hybrid materials can be optimized to increase the electromagnetic reflection–absorption properties. Thus, the obtained structure can be used in shielding and radar absorbing materials applications.Lire moins >

Langue :

Anglais

Vulgarisation :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL