Title :

Extraction of statistical properties of the point source response of a reverberant plate and application to parameter estimation (L)

Author(s) :

Moulin, Emmanuel [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Achdjian, Hossep [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Assaad, Jamal [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Abou Leyla, Najib [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Hourany, Karl [Auteur]
Lebanese University [Beirut] [LU]
Zaatar, Youssef [Auteur]
Lebanese University [Beirut] [LU]

Journal title :

Journal of the Acoustical Society of America

Pages :

2165-2168

Publisher :

Acoustical Society of America

Publication date :

2012

ISSN :

0001-4966

HAL domain(s) :

Sciences de l'ingénieur [physics]

English abstract : [en]

The point source response of a reverberant solid plate is modeled through a nonstationary Poisson process based on the image-source method. The theoretical expectation of the envelope is then derived, taking into account ...
Show more >The point source response of a reverberant solid plate is modeled through a nonstationary Poisson process based on the image-source method. The theoretical expectation of the envelope is then derived, taking into account the dispersive nature of plate waves, and validated by numerical results. Least-square curve-fitting applied to an ensemble average over N realizations can then be used to identify useful parameters such as wave velocity, plate surface, or source-receiver distance. It is shown that even values of N down to 1 (no averaging) allow a satisfying identification. Application to the estimation of the source-receiver distance using a single sensor is finally highlighted to illustrate the promising potentialities of the measurement principle proposedShow less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Non spécifiée

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL